Introduction to PeakForce AFM-IR
Wednesday, October 21 | 8:00AM PDT | 11:00AM EDT | 5:00PM CEST
Multimodal Nanoscale Analysis with Photothermal AFM-IR and PeakForce Tapping
PeakForce AFM-IR is a novel variant of the photothermal AFM-IR technique based on Bruker's PeakForce Tapping mode, offering monolayer detection sensitivity, 10 nm spatial resolution for IR measurements, and simultaneous nanoscale mechanical characterization. In this webinar, Bruker experts will introduce the technique and conclude with a live demonstration and Q&A.
Join us for this webinar to see:
- The role of gated signal detection in enhancing AFM-IR performance
- Simultaneous multimodal imaging of chemical information and mechanical properties, such as elastic modulus and adhesion
- Practical operation of Bruker's PeakForce AFM-IR mode through a live demonstration
Wednesday, October 21 | 8:00AM PDT | 11:00AM EDT | 5:00PM CEST
Introduction to PeakForce AFM-IR: Combining the best of photothermal AFM-IR and PeakForce Tapping
PeakForce AFM-IR is a novel, powerful variant of the photothermal AFM-IR technique based on Bruker’s PeakForce Tapping mode. The method has demonstrated monolayer detection sensitivity, 10 nm spatial resolution for IR measurements, and enabled simultaneous nanoscale mechanical characterizations. By detecting the AFM-IR signals during specific time segments (or ‘Gates’) of the PeakForce Tapping oscillation cycle, AFM-IR performance can be further enhanced.
In this webinar we will report:
- Operational simplicity with robust, easy-to-control parameters
- Potential to collect gated AFM-IR measurements during both the contact and non-contact parts of the PeakForce Tapping cycle, an approach which can be used to enhance spectral performance by applying an in-situ subtraction of the background signal.
- Capability to perform simultaneous multimodal imaging collecting both chemical information and mechanical properties, such as elastic modulus and adhesion.
The webinar will conclude with a live demonstration of Bruker’s PeakForce AFM-IR mode and a Q&A.
Date: September 21, 2026
Time: 8AM PDT | 11AM EDT | 5PM CEST
Location: Online
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Speakers
Dr. Qichi Hu, Senior Staff Applications Scientist
Qichi is currently a Senior Staff Applications Scientist at Bruker Nano. He received a bachelor’s degree from Peking University and Ph.D. from University of British Columbia. He then did postdocs in U.S. university and national labs. Qichi has been working on nanoIR development and applications for over a decade, at Anasys and now at Bruker.
Dr. Chunzeng Li, Senior Staff Applications Scientist, Bruker
Dr. Chunzeng Li is a Senior Staff Applications Scientist with Bruker, Nano Surfaces and Metrology Division, with over 30 years AFM experience. He received his PhD in Physical Chemistry from Xiamen University, China, and is the author of 31 international publications and 2 patents.
