AFM Modes

PeakForce Electric Force Microscopy (PeakForce EFM)

Simultaneously acquire topography, electric field distribution, and mechanical properties

In PeakForce EFM, the capabilities of EFM and PeakForce QNM are combined. PeakForce EFM provides simultaneous acquisition of topography, electric field distribution, and mechanical properties, such as adhesion, modulus, and deformation.

Similar to EFM, PeakForce EFM uses a two‑pass approach. In a first pass (main scan) topography is acquired, while in the second pass (LiftMode scan), cantilever oscillation amplitude and phase are acquired, representing the electric field variations in the sample. However, in PeakForce EFM, the TappingMode topography scan is replaced with a PeakForce Tapping scan, providing simultaneous extraction of mechanical properties (i.e., modulus, adhesion, dissipation, indentation). This approach also allows the use of cantilevers with lower spring constant, which results in lower force regimes and enhanced electric field detection sensitivity (scaling with Q/k).

Imaging of electric fields and charges with PeakForce EFM can be of interest for semiconductors, 2D materials, photovoltaics, perovskites, and general nanoelectrical materials. PeakForce EFM can be preferred over conventional EFM when there is an interest in correlating mechanical properties to electric properties, or when a higher sensitivity or higher spatial resolution is required.

Request More Information Learn More: The Definitive AFM Modes Handbook

RETURN TO AFM MODES LIST

(clockwise from top left) Thermoplastic vulcanizate with low modulus EPDM, harder polypropylene, and (charged) carbon black nanoparticles. Scan sizes (X): 3 μm, 3 μm, 3 μm.

Topic Input value is invalid.

Get instant access to the full-length AFM modes handbook.

The Definitive AFM Modes Handbook contains everything you need to understand, select, and apply AFM techniques in materials research, including:

An easy-to-use framework for understanding the seven categories of AFM modes, their capabilities, and their core uses

Detailed descriptions of 50+ modes and variants (including 300+ data images)
Summary information about what each mode is, how it works, and when to use it

Our experts' top probe recommendations for each mode

First Name Please enter your first name

Last Name Please enter your last name

Email Please enter your e-mail address

Phone Please enter a valid phone number

Company/Institution Please enter your Company/Institution

Country or Area Please select your Country

State/Province Please select your State

What best describes your current interest?

Learning: Expanding my knowledge Searching: Investigating technologies for my applications Investing: Buying in one year Purchasing: Actively in the buying process

Do you have any questions about AFM modes, instruments, or applications?

By submitting this form I confirm that I would like to be contacted by Bruker. I have taken note of the Bruker Website Privacy Notice and I agree to the Terms of Use of the Bruker website. Please accept the Terms and Conditions

^{Privacy Notice Terms of Use}

^{* Please fill out the required fields.}

Your download is now available.

Click Here to Download Handbook

Note: If you exit this page, you may not be able to reopen this download window without re-submitting the form.

AFM Modes

AFM modes and the broad capabilities from AFM beyond imaging