AFM Modes

PeakForce Electric Force Microscopy (PeakForce EFM)

Simultaneously acquire topography, electric field distribution, and mechanical properties

In PeakForce EFM, the capabilities of EFM and PeakForce QNM are combined. PeakForce EFM provides simultaneous acquisition of topography, electric field distribution, and mechanical properties, such as adhesion, modulus, and deformation.

Similar to EFM, PeakForce EFM uses a two‑pass approach. In a first pass (main scan) topography is acquired, while in the second pass (LiftMode scan), cantilever oscillation amplitude and phase are acquired, representing the electric field variations in the sample. However, in PeakForce EFM, the TappingMode topography scan is replaced with a PeakForce Tapping scan, providing simultaneous extraction of mechanical properties (i.e., modulus, adhesion, dissipation, indentation). This approach also allows the use of cantilevers with lower spring constant, which results in lower force regimes and enhanced electric field detection sensitivity (scaling with Q/k).

Imaging of electric fields and charges with PeakForce EFM can be of interest for semiconductors, 2D materials, photovoltaics, perovskites, and general nanoelectrical materials. PeakForce EFM can be preferred over conventional EFM when there is an interest in correlating mechanical properties to electric properties, or when a higher sensitivity or higher spatial resolution is required.

(clockwise from top left) Thermoplastic vulcanizate with low modulus EPDM, harder polypropylene, and (charged) carbon black nanoparticles. Scan sizes (X): 3 μm, 3 μm, 3 μm.
Input value is invalid.

Get instant access to the full-length AFM modes handbook.

The Definitive AFM Modes Handbook contains everything you need to understand, select, and apply AFM techniques in materials research, including:

  • An easy-to-use framework for understanding the seven categories of AFM modes, their capabilities, and their core uses
  • Detailed descriptions of 50+ modes and variants (including 300+ data images)
  • Summary information about what each mode is, how it works, and when to use it
  • Our experts' top probe recommendations for each mode
Please enter your first name
Please enter your last name
Please enter your e-mail address
Please enter a valid phone number
Please enter your Company/Institution
What best describes your current interest?
Please accept the Terms and Conditions

             Privacy Notice   Terms of Use


  * Please fill out the required fields.

Your download is now available.


Note:
If you exit this page, you may not be able to reopen this download window without re-submitting the form.