Bruker Nano Analytics

Bruker Nano Analytics' product portfolio includes a unique range of analytical tools for materials characterization in electron microscopes:

• energy dispersive spectrometry on scanning electron microscopes (EDS for SEM)
• energy dispersive spectrometry on transmission electron microscopes (EDS for TEM)
• electron backscatter diffraction analysis (EBSD)
• wavelength dispersive spectrometry for SEM (WDS)
• micro X-ray fluorescence analysis on SEM (micro-XRF on SEM)

Besides this unparalleled range of analytical tools for electron microscopes, Bruker also offers a variety of benchtop X-ray fluorescence micro analyzers (micro-XRF) for spatially resolved composition analysis and total reflection X-ray fluorescence (TXRF) instruments for trace element analysis for a multitude of applications in industry and research.

BNA's handheld/mobile/portable X-ray fluorescence spectrometers (handheld XRF) provide the capability to non-destructively quantify or qualify nearly any element from magnesium to uranium (depending on specific instrument configurations), delivering fast, on-site elemental analysis in a broad range of application fields.

Our in-line XRF system delivers the benefits of elemental analysis production and sorting environments, allowing for the rapid analysis, qualification and sorting of components and materials on an industrial scale.  

Visit the demo facilities in our headquarters in Berlin (Germany) or just take a virtual tour on our showroom to see and learn more about our analytical solutions. If you have any questions, please do not hesitate to contact our team of experts from sales or customer support.

Headquarters
Bruker Nano GmbH 
Am Studio 2D, 12489 Berlin, Germany
Tel. +49 30 670990-0