Bruker Nano GmbH
The Home of the Electron Microscope Analyzer Range, micro-XRF, BioAFM and more
The Bruker Nano GmbH in Berlin is the home of Bruker's electron microscope analyzer range, for elemental and microstructural analysis on electron microscopes, as well as of their benchtop micro-X-ray fluorescence analyzers (micro-XRF) for spatially-resolved composition analysis, total reflection X-ray fluorescence (TXRF) instruments for trace element analysis, and handheld/portable X-ray fluorescence spectrometers (handheld XRF) in addition to offices for Bruker AXS and Bruker Nano Surfaces & Metrology including the BioAFM instruments.
Bruker Nano GmbH: Elemental and Microstructural Analysis on Electron Microscopes
Bruker Nano's Electron Microscope Analyzer range equips electron microscopes with the ability to perform elemental and microstructural analysis.
This unique range of analytical tools for materials characterization encompasses:
Energy Dispersive Spectrometry on Scanning Electron Microscopes (EDS SEM) using the XFlash® 7 range, including the unique XFlash® FlatQUAD, which has the highest solid angle available.
Energy Dispersive Spectrometry on Transmission Electron Microscopes (EDS TEM) using the XFlash® 7 range, including the XFlash® 7T100oval.
Electron BackScatter Diffraction (EBSD) with the revolutionary eWARP - the fastest and most-sensitive EBSD detector ever.
Wavelength Dispersive Spectrometry (WDS) using the XSense detector.
Micro X-ray fluorescence analysis on SEM (micro-XRF on SEM) using the XTrace 2 excitation source alongside an XFlash® 7 detector.
Bruker AXS: Elemental Analysis, 3D X-Ray Microscopy, X-Ray Diffraction and more
Bruker AXS provides a wide range of analytical equipment - from systems for XRF analysis and X-ray diffraction, to 3D X-ray microscopes and more.
The Bruker Nano location includes offices for Bruker AXS and is the home of their benchtop X-ray fluorescence micro analyzers (micro-XRF) for spatially-resolved composition analysis, total reflection X-ray fluorescence (TXRF) instruments for trace element analysis, and handheld/portable X-ray fluorescence spectrometers (handheld XRF).
Bruker Nano Surfaces & Metrology: Atomic Force Microscopy for the Life Sciences
Bruker Nano Surfaces and Metrology (BNSM) delivers advanced instrumentation for surface characterization, tribology, mechanical testing, and metrology. Its portfolio includes cutting-edge atomic force microscopes, 3D optical profilers, nanoindenters, and more.
Bruker Nano GmbH has offices for BNSM and is the home of their BioAFM range for atomic force microscopy in the life sciences.
The Bruker Nano GmbH Headquarters and Virtual Showroom
At Bruker Nano we provide demos for our electron microscope analyzer range (EDS, EBSD, Micro-XRF on SEM) and well as micro-XRF and TXRF spectrometers.
Visit the Berlin (Germany) demo facilities or just take a virtual tour on our showroom to see and learn more about our analytical solutions.
If you have any questions, please do not hesitate to contact our team of experts from sales or customer support.
Headquarters
Bruker Nano GmbH
Am Studio 2D, 12489 Berlin, Germany
Tel. +49 30 670990-0
