Bruker Nano Analytics presents:

Advanced Material Characterization by Combined 3D EBSD/EDS Measurements and Post Processing with ESPRIT QUBE


Advanced Material Characterization

3D EBSD/EDS is a destructive tomographic method consisting of repeated sectioning and subsequent crystallographic surface characterization by Electron Backscatter Diffraction (EBSD) and simultaneous elemental analysis by EDS. Typically, an integrated in-situ sectioning technique is applied, such as an SEM based focused ion beam (FIB), to generate accurately spaced serial sections. The measured database is later reconstructed and visualized with dedicated software.

The current webinar will start with a review of the 3D EBSD technique by Dr. Stefan Zaefferer from MPIE in Düsseldorf. We will then continue with demonstrating the advanced 3D data post processing and visualization capabilities of our ESPRIT QUBE software, including slice registration (realignment), data filtering, GND calculation, grain reconstruction and subsetting.

This 45 min webinar will be round off by a 15-minute Q&A session where our experts will answer your questions.

e-Flash FS fast & sensitive EBSD detector
Raw orientation 3D EBSD map (IPF) of titanium alloy acquired with e-Flash FS

Who Should Attend?

  • FIB/SEM microscopists interested in advanced analytical techniques for material characterization
  • EBSD and EDS users curious about the 3D EBSD/EDS technique


Dr. Stefan Zaefferer

MPIE Max-Planck-Institut für Eisenforschung GmbH, Düsseldorf

Dr. Daniel Goran

Product Manager EBSD, Bruker Nano Analytics

Dr. Laurie Palasse

Senior Application Scientist EBSD, Bruker Nano Analytics