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Surface Characterization of Semiconductors: An Overview, from Topography to Advanced Physical Properties

Learn about Bruker’s high-performance metrology techniques for the nanometer-scale surface characterization of semiconductor materials and devices

Introduction to Bruker's Portfolio of Solutions for Semiconductor Characterization

Presented by Peter De Wolf, Ph.D., WW Applications Director, Bruker (April 21, 2021)

Semiconductor M3D Metrology Using Optical and Stylus Profiling

Presented by Samuel Lesko, Ph.D., Technology and Applications Development Director, Bruker; and Michael Febvre, Ph.D., Application Manager, Bruker EMEA (April 21, 2021)

CMP Tribology

Presented by Udo Volz, Ph.D., Applications Scientist, Bruker (April 21, 2021)

Mechanical Characterization of Semiconductor Samples and Devices

Presented by Ude Hangen, Ph.D., Nanomechanical Instruments Applications Manager, Bruker (April 21, 2021)

Highest Resolution 3D Metrology and Advanced Physical Property Characterization of Semiconductor Samples and Devices

Presented by Vishal Panchal, Ph.D., Applications Scientist, Bruker; and Hartmut Stadler, Ph.D., Applications Scientist, Bruker (April 21, 2021)
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