Bruker Nano Analytics Presents:

Micro-XRF Back to the Roots Series - Part II: Using micro-XRF for Qualitative Analysis

On-demand session - 59 min

Using micro-XRF for Qualitative Analysis

In the second webinar of our micro-XRF  "Back to the Roots" micro-XRF series Bruker Nano Analytic's experts will present the potential of micro-XRF as a technique for qualitative analysis.

In order to do this, we need to first clarify what the term “qualitative analysis” refers to. Generally, “qualitative analysis” is used to describe an analysis that gives results on a relative, rather than an absolute scale. For example, a qualitative analysis may yield information about the relative enrichment or depletion of an element within a sample, but not the absolute changes of concentration. Unfortunately, the meaning of the term is muddled since it is sometimes mixed-up with “semi-quantitative analysis” or even used to describe low-quality analytical results. We see qualitative analysis as a powerful approach to micro-XRF materials analysis. Given that many samples do not have a defined “composition” within the analytical volume,  a quantitative analysis cannot be the appropriate way to describe these samples.

We will illustrate the potentials of qualitative micro-XRF by presenting a variety of examples, as well as highlighting some special features of the M4 TORNADO and M6 JETSTREAM which can be used to support this type of analysis.

The examples discussed will include plant leaves as thick (but not infinitely thick) layered, complex samples, as well as wet sediment cores and some non-flat samples, representing cases where quantification is not possible due to undefined composition or geometry. In addition the use of Compton scattering or Bragg diffraction as a means to understand a sample will be discussed. 


Who Should Attend? 

  • Material scientists
  • Geo- and Bio-researchers
  • Failure analysis experts
  • Users of M4 software, interested in optimizing scanning conditions
Elemental scan of hot gun shot residue on a textile surface taken using the M4 TORNADO
Elemental scan of a non-flat sample taken using the M4 TORNADO PLUS and AMS


Falk Reinhardt

Senior Application Scientist Micro-XRF, Bruker Nano Analytics

Dr. Roald Tagle

Senior Application Scientist Micro-XRF, Bruker Nano Analytics

* The registration forms are optimized for the browser Google Chrome. The content of both sessions is identical.