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How to Extend Your Wyko and Bruker Optical Profiler Capabilities

This webinar took place on March 30th 2018

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Summary

This webinar focuses on new features in Vision64 acquisition and analysis software, improving both routine operation and adding new advanced capabilities.

Key topics include:

  • Achieving sub-nanometer vertical resolution on large stepped surfaces (e.g. MEMS, Microfluidics)
  • Breaking the diffraction limit on patterned surfaces and gratings
  • Protocols to measure highly sloped samples > 75 degrees
  • Quantify the thickness of thin transparent film down to 100nm
  • Generating reports through VisionMap64 software
  • Advanced data processing with latest S parameters (ISO25178 compliance)