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Optical Profiler Characterization of Advanced Materials Using White Light Interferometry

Learn how today's advanced optical profilers can provide rapid and highly accurate characterization solutions for materials research and development
This webinar took place on September 23rd 2020

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Research and development innovations are critical to tackle global challenges such as neutral carbon dioxide economy, higher energy efficiency, high bandwidth communication, and pandemic fighting. New materials research quickly evolves in a wide range of fields, from geology to opto-electronic, requiring dedicated and high-performance characterization tools.

This webinar provides a comprehensive explanation of roughness considerations, including such key concepts as waviness, roughness and spatial filtering. You will learn how to properly set up measurements and subsequent post-processing analyses to comply with ISO standards for mean roughness. Both profile and areal based measurements are described, with emphasis on their differences. Practical examples based on 3D optical profiler and roughness standards are also covered.

Who should attend:

  • Materials scientists
  • Bio-mechanical researchers
  • Geology & nuclear waste researchers
  • Materials development researchers & engineers
  • Waveguide optical developers

 

 

Speakers

Dr. Samuel Lesko
Dr. Samuel Lesko
Senior Application Development Manager
Dr. Alexander Nesterov-Mueller
Dr. Alexander Nesterov-Mueller
KIT, Institute of Microstructure Technology, Germany
Dr. Andreas Luttge
Dr. Andreas Luttge
MARUM, University of Bremen, Germany