[00:10:18] Torsional Force Microscopy (TFM) explained
[00:14:52] Improving image contrast by increasing torsional drive amplitude
[00:17:00] Improving image contrast by increasing vertical loading force
[00:17:51] Imaging VdW moire superlattices and atomic lattices
[00:19:53] Other TFM applications
[00:21:39] Conclusion
Watch Now | 30 Minutes
Nanoelectronic Characterization of Hexagonal Boron Nitride Using CAFM
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Presented by Mario Lanza, Ph.D., Associate Professor of Materials Science and Engineering, King Abdullah University (February 06, 2024)
PRESENTATION HIGHLIGHTS:
[00:01:12] Different methods and quality
[00:07:40] Substrate and reference samples
[00:14:35] Monolayer CVD-grown h-BN
[00:20:47] Multilayer CVD-grown h-BN
[00:29:28] Conclusions
Watch Now | 12 Minutes
Question and Answer
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PRESENTATION HIGHLIGHTS:
[00:00:00] Does a kneeling impact more a pattern period?
[00:00:51] Is there a limit to the voltages you can use for PFM?
[00:01:52] Is there any melting or tendency to reduce the conductivity in the next experiment by using higher voltages? What probe where you using for TFM?
[00:04:00] What size was the graphene lattice?
[00:05:09] Is it possible to prepare resistive memory devices out of amorphous HBN?
[00:06:48] In the case of PFM measurements, what is the maximum bias for silicon platinum tips without damaging the tip?
[00:09:58] Where was the 7.5 millivolt offset coming from?