Bruker Nano Analytics presents:

Advances in Characterization of Materials Using eFlash EBSD Detectors

On-Demand Session - 39 Minutes

Advances in Characterization of Materials

This webinar will provide details about the new generation of eFlash EBSD detectors and the application fields they cover:

The High Definition eFlashHD detector with its unmatched high pixel resolution and high pattern quality – best solution for residual strain analysis a.k.a. HR-EBSD

The Fast and Sensitive eFlashFS detector for high speed measurements in both: EBSD and TKD modes – best solution for all Hough transform based EBSD/TKD applications

Significant improvements in light sensitivity and CCD dark current make the new eFlashFS detector the perfect solution for applications like low kV EBSD, Transmission Kikuchi Diffraction (TKD) in SEM or 3D EBSD.

Application examples will demonstrate how the new eFlashFS detector makes possible ultra fast EBSD measurements on most materials. When retrofitted with OPTIMUS™ TKD detector head, the new e–FlashFS detector enables orientation mapping at the nanoscale at speeds of up to 630 frames/sec.

The webinar will be round off by a 15-minute Q&A session where our experts will answer your questions.

For TKD with best sample-detector geometry: e-Flash FS with horizontal OPTIMUS detector head.
3D EBSD reconstruction from a Ti-alloy sample using ESPRIT QUBE (IPFx coloring)

Who Should Attend?

  • All-level users interested in material characterization by EBSD/EDS
  • Researchers and specialists interested in Dark Field & Bright Field imaging as well as orientation mapping at the nanoscale
  • FIB/SEM microscopists interested in advanced analytical techniques like 3D EDS/EBSD for material characterization

Speakers

Dr. Daniel Goran

Product Manager EBSD, Bruker Nano Analytics

Dr. Laurie Palasse

Global Application Manager, Bruker Nano Analytics

Watch this Webinar On-Demand

Please enter your details below to gain on-demand access to this webinar. 

Input value is invalid.

* Please fill out the mandatory fields.

Please enter your first name
Please enter your first name
Please enter your e-mail address
Please enter your first company / institution
What best describes my current situation:
Please accept the Terms and Conditions

* Please fill out the mandatory fields.

Thank you. Enjoy your On-Demand Webinar

 

Thank you for signing up to watch our on-demand webinar Advances in Characterization of Materials Using the New e-Flash EBSD Detectors. We have also sent an email to your registered address containing the link to watch the webinar. 

If you have questions about the content of the webinar or about any of our other products and services, please contact us at info.bna@bruker.com.

You can also contact our regional offices by email at: 

Europe, Middle East and Africa: support.bna.emea@bruker.com
Asia-Pacific: support.bna.apac@bruker.com
Americas: support.bna.americas@bruker.com