Advances in Characterization of Materials Using eFlash EBSD Detectors
Advances in Characterization of Materials
This webinar will provide details about the new generation of eFlash EBSD detectors and the application fields they cover:
The High Definition eFlashHD detector with its unmatched high pixel resolution and high pattern quality – best solution for residual strain analysis a.k.a. HR-EBSD
The Fast and Sensitive eFlashFS detector for high speed measurements in both: EBSD and TKD modes – best solution for all Hough transform based EBSD/TKD applications
Significant improvements in light sensitivity and CCD dark current make the new eFlashFS detector the perfect solution for applications like low kV EBSD, Transmission Kikuchi Diffraction (TKD) in SEM or 3D EBSD.
Application examples will demonstrate how the new eFlashFS detector makes possible ultra fast EBSD measurements on most materials. When retrofitted with OPTIMUS™ TKD detector head, the new e–FlashFS detector enables orientation mapping at the nanoscale at speeds of up to 630 frames/sec.
The webinar will be round off by a 15-minute Q&A session where our experts will answer your questions.
Who Should Attend?
- All-level users interested in material characterization by EBSD/EDS
- Researchers and specialists interested in Dark Field & Bright Field imaging as well as orientation mapping at the nanoscale
- FIB/SEM microscopists interested in advanced analytical techniques like 3D EDS/EBSD for material characterization
Speakers
Dr. Daniel Goran
Product Manager EBSD, Bruker Electron Microscope Analyzers
Dr. Laurie Palasse
Global Application Manager, Bruker Nano Analytics
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