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Breakthrough Metrology Advances of 3D Optical Profilers

Learn about our 3D optical metrology solutions for improving ease-of-use and accuracy when measuring surface finishes on precision machined parts
Presented by Samuel Lesko, Ph.D., Dir. of Technology and Apps Development, Bruker Nano Surfaces & Metrology (October 22, 2018)

       PRESENTATION HIGHLIGHTS:

  • [00:01:50] Bruker WLI optical profilers and other solutions for 3D surface measurement
  • [00:04:27] Vision64 map software
  • [00:10:24] Key advancements in WLI optical profilometry technology and capabilities
    • [00:10:24] Advanced VSI mode
    • [00:20:35] Lateral resolution
    • [00:28:19] Slope measurement capabilities
    • [00:32:40] Correlate topography with optical view
    • [00:39:48] Measuring thin films
    • [00:42:26] Straightforward automation
    • [00:45:50] Stitching >1000 images
  • [00:49:54] Live audience Q&A with the speaker