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Breakthrough Metrology Advances of 3D Optical Profilers

Learn about our 3D optical metrology solutions for improving ease-of-use and accuracy when measuring surface finishes on precision machined parts

Presented by Samuel Lesko, Ph.D., Dir. of Technology and Apps Development, Bruker Nano Surfaces & Metrology (October 22, 2018)

_{PRESENTATION HIGHLIGHTS:}

[00:01:50] Bruker WLI optical profilers and other solutions for 3D surface measurement
[00:04:27] Vision64 map software
[00:10:24] Key advancements in WLI optical profilometry technology and capabilities
- [00:10:24] Advanced VSI mode
- [00:20:35] Lateral resolution
- [00:28:19] Slope measurement capabilities
- [00:32:40] Correlate topography with optical view
- [00:39:48] Measuring thin films
- [00:42:26] Straightforward automation
- [00:45:50] Stitching >1000 images
[00:49:54] Live audience Q&A with the speaker

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