Workshop: What is Full Range EDS?
Discover the Power of Full Range EDS
Join our free workshop in Berlin to learn how to increase the energy range and sensitivity of EDS analysis.
About the Workshop
Full Range EDS is Bruker ‘s analysis system consisting of two different excitation sources and an EDS detector.
The addition of the XTrace 2 micro-XRF source to a conventional EDS setup on an electron microscope creates a dual-beam system, where samples interact with either the electron beam of the SEM or the X-ray photons from the micro-XRF source, or both.
In this workshop you will learn:
- How to detect elements below the sample surface
- How to detect trace elements
- How to analyze multi-layered specimens using Bruker’s unique XMethod layer analysis software
- How to detect additional elemental line series that are not seen with conventional EDS, especially above 20 keV
- No sample preparation required! Discover how to analyze challenging samples such as: beam-sensitive, non-conductive, topographic or when sample preparation is not allowed.
- Acquire elemental maps over large areas at micrometer resolution
This workshop will be held in a small group and will comprise of presentations and live demonstrations at the microscope. The workshop is a great opportunity to learn from our experts about recent technology development and the diversity of application of micro-XRF on SEM.
Lunch will be provided to workshop attendees.
Details to Attend
When: November 19 2024
Where: The Bruker Nano Analytics Lab - Berlin, Germany
Cost: This is a free workshop. Registration mandatory.
Limited Seats - Secure your Participation Now!
Seats for our free workshop "What is Full Range EDS" are limited. Please register now using the form below to secure your place.