The Most Complete TERS Solution

Enabling highest performance AFM-Raman research

Bruker’s Innova-IRIS (Integrated AFM-Raman Imaging System) enables the emerging technique of tip-enhanced Raman spectroscopy (TERS), seamlessly blending atomic force microscopy and Raman spectroscopy.

  • Delivering high-performance TERS with complete SPM capabilities
  • Offering performance exclusively enabled by Bruker's commercially available TERS probes
  • Providing productive measurement with guaranteed TERS performance

Download Datasheet  Download Raman Solutions Brochure


Innova - The Best Place to Start Your AFM Research

This provides researchers a perfect combination of chemical or crystallographic information at high spatial and spectral resolution with the most advanced atomic force microscopy characterization. The Innova-IRIS can be integrated with your choice of a leading Raman system to provide the best opaque sample TERS investigations available today. However you tailor your system, your application will benefit from Bruker exclusive, high-contrast IRIS TERS probes and the best tip preservation and lowest drift, guaranteeing that alignment is preserved even over the optical integration times necessary to interrogate weak Raman scatterers.

Enabling highest performance AFM-Raman research

Download the AFM-Raman brochure and Innova-IRIS datasheet

Innova iris STM

Atomic-resolution STM image of highly oriented pyrolytic graphite (HOPG). Image size 1.3 nm.

Untitled 2

High-resolution topography (orange) and phase image (green) reveal the microphase separation in a poly(styrene-b-butadiene-b-styrene) (SBS) triblock copolymer. 1k x 1k unfiltered raw data.Image size: 2 μm. Closed-loop scan linearization active.

Providing Complete AFM Capabilities

All aspects of the Innova electromechanical design have been optimized, from the rigid microscope stage with a short mechanical loop and low thermal drift to the ultralow-noise electronics. The result is a unique combination of high-resolution performance and closed-loop positioning. Innova uses Bruker’s proprietary ultralow-noise digital closed-loop scan linearization for accurate measurements in all dimensions, regardless of size, offset, speed, or rotation in air and liquid. With closed-loop noise levels approaching those of open-loop operation, superior image quality is achieved from the full 90-micron scan range down to submicron images on any sample, whether it is a semiconductor, a soft and nanostructured material, or DNA.

In addition, closed-loop scan linearization can be activated and deactivated on the fly.This incredible flexibility allows zooming down to atomic resolution on any selected portion of a full size scan, without changing scanner hardware and without withdrawing the probe from the surface.

Fast Setup for Every Experiment

The patented top-down optics of the Innova integrate seamlessly with all imaging modes. With softwarecontrolled optical zoom, they provide a broad range of magnification, allowing for a direct view of the cantilever and sample with better than 1-micron resolution to identify the smallest sample features and ensure precise probe positioning. With the optics positioned entirely inside the protective instrument cover, probe and sample can be viewed at any time while insolating the instrument from the environment. The ergonomic integration of the optics with the microscope also contributes to the ease and accuracy of tip exchange and laser alignment. The user can simply drop in a new tip and swing the optics back into place. The pre-aligned cantilever will always remain in focus.

Innova has also been specifically designed to provide quick and easy tip exchange and alignment. The Innova head rests kinematically on three independently controlled motors that allow height, pitch, and tilt adjustments relative to the sample, and user-defined positions can move the head in sub-micron increments. In addition, the system comes complete with a universal chip carrier that accepts almost any unmounted cantilever.

Innova iris fast setup

High-resolution phase image reveals the microphase separation in a poly(styrene-b-butadiene-b-styrene) (SBS) triblock copolymer. Image size: 750 nm. Closed-loop linearization active.

ブルカーのInnova-IRIS(Integrated AFM-Raman Imaging System)は、新技術のチップ増強ラマンスペクトロスコピー(TERS)を実現し、原子間力顕微鏡とラマンスペクトロスコピーをシームレスに統合します。

  • SPM機能に加え、高性能TERSを実現
  • ブルカーで製造販売するTERS専用のプローブにより従来得られなかった結果を提供
  • 生産性のある計測を実現

これにより、研究者は、高空間/スペクトル分解能で得られる化学的または結晶学的な情報と最新の原子間力顕微鏡による特性解析という完璧な組み合わせを利用できるようになります。 IRIS TERS probes は、お客様が選択する主なラマンシステムと統合して、不透明な試料に対して現在実行できる最高のTERS調査を実現します。お客様がどのようにシステムを調整しようとも、ブルカー独自の高コントラストなIRIS TERS probes最高のチップ保持機構、および最小限のドリフトによって、最も弱いラマン散乱を調べるために必要な光学系の積算時間の間もアライメントが保持されることが保証されるので、お客様の用途の役に立ちます。

最も完全なTERSソリューション

最高のパフォーマンスを可能にするAFM-Raman研究

 AFM-Raman brochureInnova-IRIS datasheet をダウンロード