|PFQNM with Nanoscope V systems (Nanoscope version 9.4)
||October 10, 2018, 14:00 CET
||The aim of this webinar is to explain the quantitative nanomechanical measurements (QNM) with the Dimension Icon and the Multimode systems. The theories of force distance measurements will be presented. The calibration of probes for PFQNM measurements is important for reliable results. Therefore, the absolute and the relative calibration method will be discussed. Best known methods for successful measurements will be shown. Important parameters (i.e. synch distance, DDS3) will be discussed.
||October 11, 2018 14:00 CET
||In this webinar we like to present possibilities to obtain atomic resolution with AFM systems. STM, contact AFM and PeakForce Tapping as methods will be discussed. Sample preparation plays a crucial role for atomic resolution, so this will be part of the webinar session as well. The systems presented will be the Multimode and the Dimension Icon. Best known methods to achieve atomic resolution will be shown.
||October 12, 2018 14:00 CET
||Contact resonance is a method to determine elastic moduli higher than 70 GPa with a Dimension Icon AFM. The experimental setup and the probe selection will be discussed in this webinar. In addition, we like to show you the calibration of the probes and show measurements on the reference sample.
||October 29, 2018, 14:00 CET
||The benefits of using the Nanoscope V systems (Multimode and Icon) to measure local currents on surfaces with Tunneling AFM (TUNA) and Peak Force TUNA (PFTUNA) will be demonstrated in this webinar. The usage of the Nanoscope software will be shown. Best known methods for setting up the experiments will be presented.
|Heater/Cooler Measurements with Nanoscope systems
||October 30, 2018, 14:00 CET
||In this webinar we like to show the functionality of the heater/cooler system for the Nanoscope AFM systems. The experimental setup will be presented. The preparation of samples will be discussed. On the Dimension Icon we like to present a temperature controlled measurement.