Bruker
제품 및 솔루션 응용 분야 서비스 뉴스 및 이벤트 소개 채용
최소 두 글자를 사용해 주십시오. (현재 한 글자 사용함)

Languages

  • Deutsch
  • English
  • Español
  • Français
  • Italiano
  • Polski
  • Português
  • Русский
  • 中文
  • 日本語
  • 한국어
▶ Watch On-Demand | 1 Hr 3 Minutes

On-Demand Session: 2D Material Characterization Using Photothermal AFM-IR and s-SNOM

Learn about two complementary nanoscale IR spectroscopy and imaging techniques, photothermal AFM-IR and s-SNOM.

이 동영상을 재생하려면 쿠키를 허용해야 합니다.

Presented by Anirban Roy, Ph.D., Senior Applications Scientist, Bruker, and Cassandra Philips, Ph.D., Application Scientist, Bruker

Featured Products and Technology

nanoIR - 2D Materials and Nanophotonics

2D Materials and Nanophotonics

Unique capabilities to characterize the nanoscale optical, chemical and material properties of novel 2D and quantum materials
더 읽어보기
  • REQUEST MORE INFORMATION
Graphic representation of AFM-IR and s-SNOM tip-surface interfaces

Comparison of AFM-IR and s-SNOM

AFM-IR and s-SNOM are complementary techniques with different strengths. With the nanoIR3-s, you can choose a configuration that has one technique or both, depending on your sample and measurement.
더 읽어보기
  • REQUEST MORE INFORMATION
Nanoscale Infrared Spectrometers

Nanoscale Infrared Spectrometers

Bruker's nanoIR spectrometers are the world leader in photothermal IR spectroscopy from the nanoscale to the sub-micron and macro scales.
더 읽어보기
  • REQUEST MORE INFORMATION
  • RETURN TO SESSION OVERVIEW
Bruker
© Copyright Bruker 2025
Imprint Terms of Use Privacy Notice Cookie Notice Social Responsibility Reports