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Optical Profiler Characterization of Advanced Materials Using White Light Interferometry

Learn how today's advanced optical profilers can provide rapid and highly accurate characterization solutions for materials research and development

이 동영상을 재생하려면 쿠키를 허용해야 합니다.

Presented by Samuel Lesko, Ph.D., Director of Technology and Applications Development, TSOM Unit, Bruker; Alexander Nesterov-Mueller, Ph.D., KIT, Institute of Microstructure Technology, Germany; Andreas Luttge, Ph.D., MARUM, University of Bremen, Germany (September 22, 2020)

_{PRESENTATION HIGHLIGHTS:}

[00:02:38] Overview of the use of WLI-based 3D optical profilers for advanced materials characterization (Dr. Samuel Lesko)

[00:38:58] Verticle Scanning Interferometry for Label-Free Detection of Peptide-Antibody Interactions (Dr. Alexander Nesterov-Mueller)

[00:53:50] Steel Corrosion Kinetics Studied by Raman Coupled with Vertical Scanning Interferometry (Dr. Andreas Luttge)

[01:18:30] Live demonstration: 3D optical profiler roughness measurement of graphene flakes on silicon substrate (Dr. Samuel Lesko)

_{LIVE AUDIENCE Q&A:}

[01:25:05] Was PSI or VSI used to perform the measurements done with peptides?

[01:26:57] How are measurements—which are taken many hours apart—aligned laterally (unaffected by drift error)?

[01:29:03] How can these instruments reach a true lateral resolution of 200 nm?

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