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AFM Modes
Morphology Modes
Morphology modes are used to measure the nanoscale 3D structure of a surface. This category of modes is split into those that evaluate topography and those that evaluate domain structure.
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Everything you need to understand, select, and apply AFM techniques in materials research.
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Bruker's materials research atomic force microscopes, powered exclusively by PeakForce Tapping® technology, are helping researchers advance new nanomechanical, nanoelectrical, and nanoelectrochemical research, on the order of three peer-reviewed published articles per day.
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