The Latest Advancements in AFM Nanoelectrical Modes E-Book
Learn about the fundamental elements and advantages of AFM-based electrical characterization and how Bruker's DataCube modes expand the number and type of potential applications of nanoelectrical property measurement.
Submit the form to gain instant full-length access to chapters on:
- The history, advantages, and constraints of atomic force microscopy (AFM), especially for electrical characterization.
- The far-reaching academic, scientific, and industry impacts of AFM-based nanoscale electrical property characterization.
- How 3D nanoelectrical property mapping — made possible with DataCube modes — removes the operational, technical, and analytical limitations that have historically restricted innovation.
- Case studies of practical applications of AFM nanoelectrical modes.
Download the Full-Length PDF
Your download is now available.
Note: If you exit this page, you may not be able to reopen this download window without re-submitting the form.
