FT-IR spectroscopy is an easy-to-use and nondestructive analysis tool for chemical identification, quantification, composition analysis, optical characterization and many more. Depending on measurement geometry (beside transmission measurement) and optical properties of sample materials FT-IR can be very surface sensitive. It provides plenty of surface analysis techniques with different penetration depth to qualitatively or quantitatively characterize the upper layer of a sample, to follow surface reactions or to observe surface emissions etc. Depending on sample form, e.g. powder, gel, liquid, crystal blocks, coatings, micro sized samples or else, different FT-IR techniques can be applied.
There will be three parts of this webinar series. For the first two parts an additional repeat session is available on the same day. Feel free to choose the more convenient time slot for you:
Part I Tue, Sep 20
01:00 PM – 02:00 PM CEST
07:00 PM – 08:00 PM CEST repeat
Part III Tue, Oct 4
07:00 PM – 08:00 PM CEST
Part II Tue, Sep 27
01:00 PM – 02:00 PM CEST
07:00 PM – 08:00 PM CEST repeat
Dr. Xia Stammer studied Physical Chemistry and focused on surface functionalization and characterization during her PhD and research activities. She has been FT-IR application specialist since almost 10 years at Bruker and is specialized for FT-IR research solutions for catalysis, material science and surface analysis.
Dr. Inga Köhler studied Geology and Paleontology and acquired her PhD with focus on Early Earth. Inga has a strong interest in communicating scientific topics to the public and continues to contribute to Archean research. At Bruker, she works as a Scientific Content Creator for FT-IR and Raman spectroscopy as well as microscopy.