Vutara Biplane Banner v1

Standard Acquisition Features

  • 3-D localization data up to 1 um in Z for all acquisition
  • Video rate live cell nanoscale imaging
  • Z step acquisitions for thicker volumes
  • Real time localization during acquisition
  • Multiple location acquisition
  • Active Z drift correction
  • Simultaneous 2 color 3-D acquisition
  • Sequential and interleaved multicolor acquisition
  • Wide field reference images for localization experiments
  • Wide field work for wide field time lapse 

Instrument options

  • Confocal scanner for correlative imaging
  • 750 nm imaging laser
  • TIRF illumination 

Analysis Features

  • Spatial distribution:  Provides a variety of tools for analyzing spatial distribution relationships of particles including Ripley’s K, Pair correlation and Nearest Neighbors
  • Cluster Analysis: Counts clusters, cluster sizes, cluster densities, intra/inter-cluster relationships
  • Co-localization: Provides statistical measures on relationships between particles or clusters of two different labels
  • Resolution Analysis:  Quantifies resolution for images derived from localized data sets
  • Live Cell Analysis: Tracking of clusters in live cell experiments with mean squared displacement and angular displacement analysis
  • Control Data: Generate statistically random data to use as comparative data controls

Vutara 352 Specifications

Lateral Resolution 20 nm*
Axial Resolution 50 nm*
Acquisition Speed Localization microscopy: up to 3,000 fps, Widefield: Up 30 fps
Cameras (two included) Localization microscopy: sCMOS (4.2 MP, 6.5 um x 6.5 um pixels 80% QE; Widefield sCMOS, 2.3 MP. 5.85 um x 5.86 um pixels, 80% QE
Stage X,Y scanning stage with linear encoders, 120 mm x 72 mm range, 50 nm resolution
Piezo Focus Objective mount piezo, 400 um range, 0.7 nm resolution
Field of View Localization microscopy: 20 um x 20 um standard, 40 x 40 um optional; widefield 187 um x 187 um; confocal 87 um x 87 um
Objectives Standard: Water, 60x 1.2 NA; optional: Silicone 60x, 13 NA; Oil 60 x 1.49 NA
Standard Layers 100 mW 405 nm; 1 W 488 nm , 561 nm and 640 nm

* Performance is sample and room dependent, typical resolutions can vary based upon preparation. Lateral resolution test specification with Tetraspek beads is , X,Y resolution should be less or equal to 20 nm and Z resolution less or equal to 50 nm. Colocalization tests with Tetraspek bead using three color is , X,Y colocalization between colors colors should be less or equal to 30 nm and Z colocalization between colors should be less or equal to 50