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Brochures & Datasheets

• ContourGT-X 3D Optical Profiler - Datasheet 1.0 MB
The Contour Elite X 3D Optical Microscope combines more than three decades of surface metrology innovation and experience from industry partnerships into a single benchtop system to deliver production-ready automation, measurement flexibility, high-fidelity imaging, and proven performance.

• Contour Elite Line of 3D Optical Microscopes - Brochure 2.0 MB
Researchers, metrologists, and engineers no longer have to choose between accurate metrology and visually compelling imaging-based measurements. Bruker’s Contour Elite 3D optical microscopes combine the ContourGT platform’s proven, industry-leading metrology and Vision64 analysis software with exceptional new high-fidelity imaging capabilities. Contour Elite systems deliver the high-speed operation, accuracy,and repeatability that top-level R&D and production requires, and adds the imaging and display advantages commonly associated with confocal microscopy.

• Contour Elite Objectives Chart - Datasheet 0.5 MB
Reference sheet of objectives for Contour Elite series optical microscopes that includes field-of-view and spatial sampling specifications.

• AcuityXR Enhanced-Resolution Microscopy Technology - Datasheet 1.1 MB
AcuityXR is a revolutionary optical surface profiler measurement capability that combines patented Bruker hardware and software technology to enable select Contour Elite  3D Optical Surface Microscopes to break the optical diffraction limit and deliver lateral resolutions previously considered unattainable with conventional optical microscopy techniques.

Application Notes

• Performing Comprehensive Wafer Inspection with Non-Contact 3D Optical Profiling - AN559 3.1 MB
This application note discusses how 3D optical profiling provides many advantages over other measurement techniques for non-contact inspection of semiconductor packaging front-end process research and control. These advantages range from fully automated measurements and non-destructive inspection to custom analyses and fast measurement speeds.

• 3D Optical Microscopy for Orthopedic Implants - AN551 1.9 MB
This application note explores the use of 3D optical microscopy in both the R&D and quality control stages of orthopedic implants manufacturing.

• Optical Profiling Provides 3D Measurement of Blades and Sharps - AN538 1.3 MB
3D surface inspection of blades and sharps can provide valuable information about lifetime and quality of performance to manufacturers.

• Optical Profiling Enables High Volume Stent Manufacturing - AN537 1.3 MB
This application note discusses how optical profiling provides non-contact, 3D measurement of stent shape, defects, and coatings, to enable high-volume production measurement.

• Characterizing Surface Quality - Why Average Roughness is Not Enough - AN511 6.3 MB
In this application note we explore how 3D parameters can be employed to provide great insight into surface finish and performance.

• Comparing 3D Optical Microscopy Techniques for Metrology Applications - AN503 1.6 MB
This application note investigates the principles of operation for white light interferometry (WLI) and confocal microscopy, also known as laser scanning confocal microscopy (LSCM), and discusses their different advantages and disadvantages for metrology.

Publications

• 3D Optical Microscopy  548 kB
Novus Light Technologies Today, January 2013 Article discussing the measurement of surface topography using 3D optical microscopes in a variety of industries.