Rozwiązania do prób i pomiarów dla przemysłu i badaczy

Próby i pomiary

Wiodące narzędzia do analizy powierzchniowej i wymiarowej na potrzeby prób i pomiarów

3D Optical Profilers

3D Optical Profilers

Non-contact 3D surface measurement, inspection, and analysis

Dimensional Metrology Systems

Dimensional Metrology Systems

Industrial quality assurance in all branches of precision manufacturing

OVERVIEW-filmtek

Ellipsometers and Reflectometers

High-accuracy film measurement well beyond the thickness range and refractive index resolution of traditional ellipsometers/reflectometers

Nanomechanical Instruments for Microscopes

Nanomechanical Instruments for Microscopes

Equipment for nanomechanical and nanotribological testing in conjunction with Raman, XRD, Optical Microscope, and AFM techniques

Nanomechanical Instruments for SEM/TEM

Nanomechanical Instruments for SEM/TEM

Hysitron PicoIndenters for in-situ mechanical experiments in scanning electron and transmission electron microscopes

Nanomechanical Test Systems

Nanomechanical Test Systems

Stand-alone solutions for highly accurate and reliable quantitative mechanical and tribological characterization at the nano- and microscales

Dektak Stylus Profilometers

Stylus Profilometers

Surface roughness characterization, step height measurements, and film stress analyses

Tribometers and Mechanical Testers

Tribometers and Mechanical Testers

Testing and measurement of friction, wear, and material mechanical properties

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