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Related Literature

Brochures and Datasheets

•  Dimension FastScan Atomic Force Microscope - Brochure  3.3 MB
The Dimension FastScan™ atomic force microscope delivers extreme imaging speed without sacrificing legendary Dimension Icon® resolution and performance. This breakthrough innovation enables radically faster time to publishable data for all levels of AFM expertise.

• PeakForce Tapping - Brochure 2.7MB
Bruker’s exclusive PeakForce Tapping is the most significant scientific breakthrough in atomic force microscope (AFM) technology since the introduction of TappingMode. It provides unprecedented high resolution imaging, extends AFM measurements into a range of samples not previously accessed and uniquely enables simultaneous nanoscale property mapping.

•  PeakForce SECM - Brochure 2.2MB
Bruker’s exclusive PeakForce SECM™ mode is the world’s first complete commercial solution for AFM-based scanning electrochemical microscopy (SECM) with a spatial resolution less than 100 nanometers.

• Dimension Icon SSRM - Datasheet 1.0MB
Bruker’s Dimension Icon SSRM-HR AFM configuration extends the spatial resolution and repeatability of scanning spreading resistance microscopy (SSRM) carrier profiling to address the stringent needs of current and future ITRS technology nodes. 

• AutoMet AFM Software - Datasheet 1.6MB
Bruker’s AutoMET™ software brings high-volume, precise AFM measurements to demanding production environments. Available for Dimension FastScan and Dimension Icon systems, AutoMET uniquely enables the combination of high-resolution AFM imaging with fast, automated metrology.

Application Notes

Quantitative Measurements of Elastic and Viscoelastic Properties with FASTForce Volume CR - AN148 3.3MB
Contact resonance captures both elastic and viscoelastic properties including storage modulus, loss modulus, and loss tangent for materials from soft polymers to metals. FASTForce Volume CR uniquely exploits AC force volume mapping to offer over 15 different mechanical data channels including adhesion without tip wear or sample damage.

An Introduction to AFM-Based Scanning Electrochemical Microscopy: PeakForce SECM - AN147 1.6MB
This application note discusses PeakForce SECM, the world’s first complete commercial solution for AFM-based scanning electrochemical microscopy. With a spatial resolution less than 100 nm, PeakForce SECM uniquely provides simultaneous capture of topographical, electrochemical, electrical, and mechanical maps with nanoscale lateral resolution.

Nanoscale Mapping of Permittivity and Conductivity with Scanning Microwave Impedance Microscopy - AN146 1.9MB
This application note provides an introduction of sMIM and its integration with Bruker’s versatile AFM Dimension AFMs.

Survey, Screening, Dynamics: High-Speed Atomic Force Microscopy - AN134 6.2 MB
Bruker’s Dimension FastScan development team worked with many AFM leaders to create an AFM that ideally marries high-resolution performance with rapid imaging.

Introduction to Bruker's ScanAsyst and PeakForce Tapping Atomic Force Microscope Technology - AN133 4.9 MB
PeakForce Tapping and ScanAsyst are two Atomic Force Microsocope (AFM) imaging techniques for Bruker's atomic force microscopes. In this application note we will explain the underlying physical background, fit PFT into the framework of existing AFM modes, and show the benefits of these new modes through application examples.

Support Documents

Bruker Support Programs

Your metrology instrumentation is a major investment that is critical to your business operation and success. In today’s competitive climate, it is more important than ever to extend the functionality and peak performance of your metrology equipment years beyond the expiration of your factory warranty. Bruker’s Support Programs will help ensure that your investment is protected, and that you and your Bruker instrument are always operating at peak performance.

Publications & Videos

Product Tour @ Seeing at the Nanoscale 2012
Get a guided tour of the Dimension FastScan from Bruker's european applications lab manager, Samuel Lesko. This short interview provides an up-close demonstration of the instrument.
Courtesy of www.physicsworld.com