• Quantitative Measurements of Elastic and Viscoelastic Properties with FASTForce Volume CR - AN148 3.27MB
Contact Resonance captures both elastic and viscoelastic properties including storage modulus, loss modulus, and loss tangent for materials from soft polymers to metals. FASTForce Volume CR uniquely exploits AC force volume mapping to offer over 15 different mechanical data channels including adhesion without tip wear or sample damage.
• PeakForce SECM - AN147 1.64MB
This application note discusses PeakForce SECM™, the world’s first complete commercial solution for AFM-based scanning electrochemical microscopy. With a spatial resolution less than 100 nm, PeakForce SECM uniquely provides simultaneous capture of topographical, electrochemical, electrical, and mechanical maps with nanoscale lateral resolution.
• Survey Screening Dynamics High-Speed Atomic Force Microscope 6.2 MB
Bruker’s Dimension FastScan™ development team worked with many AFM leaders to create an AFM that ideally marries high-resolution performance with rapid imaging.
• Introduction to Brukers ScanAsyst and PeakForce Tapping Atomic Force Microscope Technology 4.9 MB
PeakForce Tapping™ and ScanAsyst™ are two Atomic Force Microsocope (AFM) imaging techniques for Bruker's atomic force microscopes. In this application note we will explain the underlying physical background, fit PFT into the framework of existing AFM modes, and show the benefits of these new modes through application examples.
•Bruker Support Programs
Your metrology instrumentation is a major investment that is critical to your business operation and success. In today’s competitive climate, it is more important than ever to extend the functionality and peak performance of your metrology equipment years beyond the expiration of your factory warranty. Bruker’s Support Programs will help ensure that your investment is protected, and that you and your Bruker instrument are always operating at peak performance.
Product Tour @ Seeing at the Nanoscale 2012
Get a guided tour of the Dimension FastScan from Bruker's european applications lab manager, Samuel Lesko. This short interview provides an up-close demonstration of the instrument.
Courtesy of www.physicsworld.com