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Highest Performance AFM with Co-Localized Micro-Raman Capability

Incorporating the industry-leading AFM and a research-grade confocal Raman microscope on a single platform.

With the introduction of integrated Raman spectroscopy capability, Bruker's Dimension Icon® platform again sets a new standard in high-performance surface characterization, enabling colocalized measurements with unsurpassed efficiency and ease.

The Icon AFM-Raman system brings together the complimentary techniques of atomic force microscopy and Raman microscopy to provide critical information on both the topography and the chemical composition of a sample.

AFM-Raman Solutions

When these techniques are further enhanced with advanced AFM modes, such as Bruker exclusive PeakForce TUNA™ electrical characterization and PeakForce QNM® quantitative nanomechanical mapping, researchers are able to better understand the mechanisms that lead to specific material properties.

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