Atomic Force Microscope

Dimension Icon-Raman

Highest performance AFM with integrated Raman spectroscopy

Dimension Icon-Raman

The Icon AFM-Raman system brings together the complimentary techniques of atomic force microscopy and Raman microscopy to provide critical information on both the topography and the chemical composition of a sample. When these techniques are further enhanced with advanced AFM modes, such as Bruker-exclusive PeakForce TUNA™ electrical characterization and PeakForce QNM® quantitative nanomechanical mapping, researchers are able to better understand the mechanisms that lead to specific material properties.

AFM and u-Raman data
Enables co-localized measurements with unsurpassed efficiency and ease.
AFM modes
Help researchers better understand the mechanisms that lead to specific material properties.
Dimension Icon platform
Sets a new performance standard for micro-Raman research capabilities.

Configuration Stability and Flexibility

The AFM-Raman system, consisting of the Dimension Icon® AFM and a research-grade confocal Raman microscope (Horiba, LabRam), is on a single, rigid, anti-vibration platform. This configuration allows the system to maintain each individual instrument's full functionality, providing optimum combined performance. As an example, the confi guration enables the full complement of Icon upgrades, AFM modes, and ease-of-use features, including Bruker-exclusive ScanAsyst®. You are able to tailor the most effective combination of modes for your application.

Series of images showing the topography (left), young’s modulus (middle) and Raman map (right) of the cross section of a layered polystyrene / polypropylene structure (image size 40μm x 40μm). PeakForce QNM provides quantitative information of the elasticity/stiffness of a sample. The change in contrast is due to the higher elastic constant of polystyrene (dark) vs. polypropylene (bright). In comparison, the Raman map clearly shows the regions of different chemical composition (polystyrene in green, polypropylene in red) demonstrating the excellent correlation of the methods.

Seamless Technique and Analysis Integration

Dimension Icon-Raman in AFM measurement position. Here acquiring quantitative nanomechanical data on a polymer blend.

Within seconds a sample can be transferred between the two techniques without disturbance. AFM and spectroscopic measurements of the same sample area are carried out consecutively without danger of misalignment or imprecise location of features. Raman mapping and imaging results can easily be correlated with AFM images using MIRO®, Bruker’s powerful microscopy overlay software. Stacks of data sets (topography, modulus and adhesion maps) can be overlaid with a chemical distribution map to provide comprehensive correlated information of the inspected surface area.

AFM Modes

Expand Your Applications with AFM Modes

With an unrivalled suite of imaging modes available, Bruker has an AFM technique for every investigation.

Built on the backbone of core imaging modes—Contact Mode and Tapping Mode—Bruker offers AFM modes that allow users to probe their samples’ electrical, magnetic, or materials properties. Bruker’s innovative new PeakForce Tapping technology represents a new core imaging paradigm that has been incorporated into several modes, providing topographic, electrical, and mechanical properties data in parallel.

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