Dimension Icon-Raman
Dimension Icon-Raman
The Icon AFM-Raman system brings together the complimentary techniques of atomic force microscopy and Raman microscopy to provide critical information on both the topography and the chemical composition of a sample. When these techniques are further enhanced with advanced AFM modes, such as Bruker-exclusive PeakForce TUNA™ electrical characterization and PeakForce QNM® quantitative nanomechanical mapping, researchers are able to better understand the mechanisms that lead to specific material properties.
Configuration Stability and Flexibility
The AFM-Raman system, consisting of the Dimension Icon® AFM and a research-grade confocal Raman microscope (Horiba, LabRam), is on a single, rigid, anti-vibration platform. This configuration allows the system to maintain each individual instrument's full functionality, providing optimum combined performance. As an example, the confi guration enables the full complement of Icon upgrades, AFM modes, and ease-of-use features, including Bruker-exclusive ScanAsyst®. You are able to tailor the most effective combination of modes for your application.
Seamless Technique and Analysis Integration
Within seconds a sample can be transferred between the two techniques without disturbance. AFM and spectroscopic measurements of the same sample area are carried out consecutively without danger of misalignment or imprecise location of features. Raman mapping and imaging results can easily be correlated with AFM images using MIRO®, Bruker’s powerful microscopy overlay software. Stacks of data sets (topography, modulus and adhesion maps) can be overlaid with a chemical distribution map to provide comprehensive correlated information of the inspected surface area.
Contact us to discuss your measurement requirements, the systems best-suited to your applications, and options for system specialization, or submit a sample run request to validate that a Bruker AFM will meet your specific needs.
Expand Your Applications with AFM Modes
With an unrivalled suite of imaging modes available, Bruker has an AFM technique for every investigation.
Built on the backbone of core imaging modes—Contact Mode and Tapping Mode—Bruker offers AFM modes that allow users to probe their samples’ electrical, magnetic, or materials properties. Bruker’s innovative new PeakForce Tapping technology represents a new core imaging paradigm that has been incorporated into several modes, providing topographic, electrical, and mechanical properties data in parallel.
Icon-Raman Data Gallery
