Dimension Icon-Raman AFM

Dimension Icon-Raman

The Icon AFM-Raman system brings together the complimentary techniques of atomic force microscopy and Raman microscopy to provide critical information on both the topography and the chemical composition of a sample. When these techniques are further enhanced with advanced AFM modes, such as Bruker-exclusive PeakForce TUNA™ electrical characterization and PeakForce QNM^®quantitative nanomechanical mapping, researchers are able to better understand the mechanisms that lead to specific material properties.

Correlated

AFM and u-Raman data

Enables co-localized measurements with unsurpassed efficiency and ease.

Advanced

AFM modes

Help researchers better understand the mechanisms that lead to specific material properties.

Proven

Dimension Icon platform

Sets a new performance standard for micro-Raman research capabilities.

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Features

Configuration Stability and Flexibility

The AFM-Raman system, consisting of the Dimension Icon^® AFM and a research-grade confocal Raman microscope (Horiba, LabRam), is on a single, rigid, anti-vibration platform. This configuration allows the system to maintain each individual instrument's full functionality, providing optimum combined performance. As an example, the confi guration enables the full complement of Icon upgrades, AFM modes, and ease-of-use features, including Bruker-exclusive ScanAsyst^®. You are able to tailor the most effective combination of modes for your application.

Series of images showing the topography (left), young’s modulus (middle) and Raman map (right) of the cross section of a layered polystyrene / polypropylene structure (image size 40μm x 40μm). PeakForce QNM provides quantitative information of the elasticity/stiffness of a sample. The change in contrast is due to the higher elastic constant of polystyrene (dark) vs. polypropylene (bright). In comparison, the Raman map clearly shows the regions of different chemical composition (polystyrene in green, polypropylene in red) demonstrating the excellent correlation of the methods.

Seamless Technique and Analysis Integration

Dimension Icon-Raman in AFM measurement position. Here acquiring quantitative nanomechanical data on a polymer blend.

Within seconds a sample can be transferred between the two techniques without disturbance. AFM and spectroscopic measurements of the same sample area are carried out consecutively without danger of misalignment or imprecise location of features. Raman mapping and imaging results can easily be correlated with AFM images using MIRO^®, Bruker’s powerful microscopy overlay software. Stacks of data sets (topography, modulus and adhesion maps) can be overlaid with a chemical distribution map to provide comprehensive correlated information of the inspected surface area.

Contact us to discuss your measurement requirements and options for system specialization, or submit a sample run request to learn how a Bruker AFM is best suited for your applications.

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AFM 모드

AFM 모드로 애플리케이션 확장

타의 추종을 불허하는 이미징 모드 제품군을 갖춘 Bruker는 모든 연구를 위한 AFM 기술을 보유하고 있습니다.

핵심 이미징 모드(Contact Mode와 Tapping Mode)의 근본을 기반으로 구축된 Bruker는 사용자가 샘플의 전기적, 자기적 또는 재료 특성을 조사할 수 있는 AFM 모드를 제공합니다. Bruker의 혁신적인 새로운 PeakForce Tapping 기술은 지형, 전기 및 기계적 특성 데이터를 병렬로 제공하는 여러 모드에 통합된 새로운 핵심 이미징 패러다임을 나타냅니다.

AFM 모드에 대해 자세히 알아보기

Icon-Raman Data Gallery

PeakForce QNM modulus image of a polystyrene/polypropylene structure (left), and Raman map of the same area (right, polystyrene in green, polypropylen in red). Variations in material properties are seen to correspond with different chemical compositions, allowing the quantitative nanomechanical information in the modulus image to serve effectively as a higher resolution chemical map.

Overlaid AFM ScanAsyst image (brown), Raman chemical map (green) and optical view (grey) of a polymer blend containing polystyrene and low-density polyethylene. Raman data courtesy of J. Schreiber, Horiba.