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The Dimension Icon AFM-Raman system, consisting of the Icon AFM and a research-grade confocal Raman microscope (Horiba, LabRam, etc.), is on a single, rigid, anti-vibration platform. This configuration allows the system to maintain each individual instrument’s full functionality, providing optimum combined performance.

Key Features

  • Fully integrated system delivers convenient correlation of advanced AFM data with information on chemical composition or crystallographic structure
  • High-resolution X-Y stage permits fast and accurate positioning between the AFM and Raman microscope
  • Full range of AFM capabilities provides more features than any other system
  • PeakForce QNM® enables quantitative nanoscale mechanical property mapping
  • „„Wide-open access to tip and sample accommodates a large variety of standard and customized experiments
  • „„ScanAsyst® enables dramatically more productive imaging with fully automatic parameter optimization, guaranteeing best results on the most delicate samples
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Dimension Icon-Raman in Raman measurement position. Here acquiring a correlated Raman chemical map of the same polymer blend.