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Brochures & Datasheets

• Innova-IRIS AFM-Raman System - Data sheet 732kB
The Bruker Innova AFM delivers accurate, high-resolution imaging and a wide range of functionality for the physical, life, and material sciences. 

• AFM-Raman Solutions - Brochure 2.7MB
Bruker has combined the most advanced AFM and Raman techniques into powerful, seamlessly integrated research solutions.


Innova SPM - Brochure 1.4MB
Innova-IRIS builds on leading AFM performance to provide the best TERS-enabled AFM-Raman integration available.


• Worldwide Service and Support - Brochure 2.7MB
Our highly trained team of support engineers, application scientists, and subject-matter experts are wholly dedicated to maximizing your productivity with system service and upgrades, as well as application support and training across a very wide range of disciplines.


• "Atomic Force Microscopy with Raman and Tip-Enhanced Raman
Microscopy Today, Nov 2012 (p.22-27) 
Authors: Stefan B. Kaemmer, Ton Ruiter, and Bede Pittenger

Application Notes

Advances in Combined Atomic Force and Raman - AN136 5.1MB
This application note looks both at the complementary information gained from combining AFM and Raman spectroscopy and how a researcher having access to a combined system can benefit from the additional information available.

AFM and Raman TERS - Correlated Imaging and Tip Enhanced Raman Scattering 2.8MB
Co-localized AFM and Raman instrumentation allows researchers to interrogate samples using both scanning probe techniques and optical spectroscopy, yielding detailed information about nanoscale properties and composition. Diffraction-limited AFM-Raman experiments are straightforward as is the interpretation of data. TERS provides chemical information on the nanometer scale. TERS experiments are straightforward to execute but may require special consideration of the tip-sample interaction in the optical near-field for data interpretation.