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Brochures and Datasheets

• PeakForce SECM - Brochure  1.64MB

Bruker’s exclusive PeakForce SECM™ mode is the world’s first complete commercial solution for AFM-based scanning electrochemical microscopy (SECM). With a spatial resolution less than 100 nanometers, PeakForce SECM™ uniquely provides simultaneous capture of topographical, electrochemical, electrical, and mechanical maps with nanoscale lateral resolution.

• PeakForce Tapping - Brochure

Bruker’s exclusive PeakForce Tapping® is the most significant scientific breakthrough in atomic force microscope (AFM) technology since the introduction of TappingMode™. It provides unprecedented high resolution imaging, extends AFM measurements into a range of samples not previously accessed and uniquely enables simultaneous nanoscale property mapping.

 

 

Application Notes

• PeakForce SECM - AN147  1.64MB

This application note discusses PeakForce SECM™, the world’s first complete commercial solution for AFM-based scanning electrochemical microscopy. With a spatial resolution less than 100 nm, PeakForce SECM uniquely provides simultaneous capture of topographical, electrochemical, electrical, and mechanical maps with nanoscale lateral resolution.

Publications

“Atomic force microscopy with nanoelectrode tips for high resolution electrochemical, nanoadhesion and nanoelectrical imaging” M. Nellist, Y. Chen, A. Mark, S. Gödrich, C. Stelling, J.Jiang, R. Poddar, C. L, R. Kumar, G. Papastavrou.

Nanotechnology,  Volume 28,  Number 9 (2017)

 

“PeakForce Scanning Electrochemical Microscopy with Nanoelectrode Probes” Z. Huang, P. De Wolf, R. Poddar,C. Li, A. Mark,M. R. Nellist, Y. Chen, J. Jiang, G. Papastavrou, S. W. Boettcher, C. Xiang, B. S. Brunschwig

Microscopy Today Volume 24, Issue 6, pp. 18 -25 (2016)