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Brochures & Datasheets

• PeakForce Tapping Brochure 

Bruker’s exclusive PeakForce Tapping® is the most significant scientific breakthrough in atomic force microscope (AFM) technology since the introduction of TappingMode™. It provides unprecedented high resolution imaging, extends AFM measurements into a range of samples not previously accessed and uniquely enables simultaneous nanoscale property mapping.

• PeakForce sMIM - App Note 2.5MB

Scanning microwave impedance microscopy (sMIM) is an AFM-based technique for materials and device characterization that does not require making electrical contact between the sample and the substrate.It works by reflecting the microwave signal from the tip-sample interface to reveal the electrodynamic properties of the sample surface and sub surface due to the penetration of the near field signal.