Conductive AFM (C-AFM)

High-resolution current and topography mapping

Researchers map variations of electrical conductivity for a range of studies and processes, including electrical defect characterization and investigation of conductive polymers, semiconductors, nanotubes, and even certain organic materials.

Conductive AFM (C-AFM), and the related modes Tunneling AFM (TUNA) and PeakForce TUNA™, are powerful current-sensing techniques that represent part of Bruker’s array of Nanoelectrical Characterization Modes.

C-AFM is a secondary imaging mode derived from Contact Mode that characterizes conductivity variations across medium- to low-conducting and semiconducting materials. It is used to measure and map current in the 2pA to 1µA range while simultaneously collecting topographic information.

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TUNA and Conductive AFM use contact mode AFM and a conductive probe. Sensor signal is the electric current between tip and sample for an applied DC bias. In feedback mode, the output signal is the DC bias, adjusted to maintain the electric current setpoin