Piezoresponse Force Microscopy (PFM)

Characterize the electromechanical properties of piezoresponsive materials at the nanoscale

Piezoresponsive materials are substances that undergo mechanical deformation in response to an applied voltage. The properties of piezoresponsive materials make them useful in a wide range of areas, from Microelectromechanical Systems (MEMS) to biosensors.

Ferroelectric materials are a subset of piezoelectrics that have particularly advantageous functional properties. As process control improves and fabrication of small volume ferroelectrics becomes more common, researchers have discovered that the physical characteristics of these materials change as they shrink. Piezoresponse Force Microscopy (PFM) enables high-resolution nanoscale characterization of piezoresponsive materials and topographical imaging using Contact Mode scanning. Using Bruker’s NanoMan and NanoPlot software packages, users can also perform Nanolithography using PFM.


Featured on the following Bruker AFMs:

Available on the following Bruker AFMs:

Recommended AFM probes:

Small defect in the poling boundary of a lithium niobate film.