Nanoparticles | Bruker


Nanoscale particles are playing an increasingly important role as a component in modern engineered products. For example, nanoparticles are often added to composites to augment the overall mechanical, optical, electronic, or thermal properties of a given materials system. With respect to mechanical properties, the small volume of material minimizes the overall concentration of defects that are responsible for strength limitations and initiation of deformation processes in bulk materials, resulting in a strength increase. Researchers in academia and industry alike continue to investigate ways to exploit these phenomena for materials used in the aerospace, electronics, and automotive industries.

In order to reliably predict and optimize the characteristics of a composite material, the individual properties of each component must be known. Nanoscale particles present a challenge for mechanical characterization, since the limited stress and strain capacity for an individual particle demands an extremely precise measurement device, as well as the ability to properly align the sensing equipment with an isolated particle. Leveraging the high resolution imaging capabilities of electron microscopes (SEM, TEM) allows such measurements to be conducted with confidence since the alignment can be verified prior to test initiation, and the testing outcomes can be scrutinized during and after the test.

Application Notes

Microscope Instruments for Nanoparticle Characterization

Hysitron PI 85L SEM PicoIndenter | Bruker

PI 85L SEM PicoIndenter

Depth-sensing nanomechanical test instrument that can be interfaced with scanning electron microscopes (SEM).

Hysitron PI 8X SEM PicoIndenter BRUKER

PI 89 SEM PicoIndenter

Bruker’s comprehensive in-situ nanomechanical test instrument for SEM and FIB/SEM, featuring our full suite of techniques.

Hysitron PI 95 TEM PicoIndenter | Bruker

PI 95 TEM PicoIndenter

The first full-fledged depth-sensing indenter capable of direct-observation nanomechanical testing inside a transmission electron microscope (TEM).