Film Characterization | Bruker

Films (500nm-5μm)

Quantitative Nanoscale and Microscale Mechanical, Tribological, and Interfacial Adhesion Characterization

Films are rarely homogenous, isotropic materials. They are oftentimes comprised of relatively complex microstructures with localized variability in phase and composition. Some films are functionally graded to meet specific application needs, while other gradients are the result of misunderstood material behavior and processing parameters. Localized properties can play a large role in determining the performance of the overall film. Nanoscale-to-microscale mechanical and tribological characterization is critical for streamlined development, optimization, and implementation of new film technologies.

Bruker has developed a comprehensive set of mechanical and tribological testing techniques to characterize film properties over the nanometer-to-micrometer length scales. Nanoindentation and microindentation-based techniques combined with high accuracy test positioning provides the ability to measure elastic-plastic, viscoelastic and fracture behavior of localized regions of the film system, enabling a constituent approach to understanding overall film performance. Additionally, Bruker’s multi-axis transducer technologies provide the ability to quantitatively measure tribological behavior and interfacial adhesion properties of films.

Application Notes

Standalone Test Equipment for Quantitative Film Characterization

Hysitron TI 980 TriboIndenter | Bruker

TI 980 TriboIndenter

Bruker's most advanced nanomechanical and nanotribological test instrument, operating at the intersection of maximum performance, flexibility, reliability, sensitivity and speed.

Hysitron TI Premier | Bruker

TI Premier

Versatile nanomechanical and nanotribological test instrument, supporting a broad range of hybrid and correlative characterization techniques.

Hysitron TS 77 Select Nanoindenter | Bruker

TS 77 Select

Dedicated nanomechanical test instruments, providing an essential toolkit of core nanoscale mechanical characterization techniques.

Microscope Test Equipment for Quantitative Film Characterization

Hysitron PI 85L SEM PicoIndenter | Bruker

PI 85L SEM PicoIndenter

Depth-sensing nanomechanical test instrument that can be interfaced with scanning electron microscopes (SEM).

Hysitron PI 8X SEM PicoIndenter BRUKER

PI 89 SEM PicoIndenter

Bruker’s comprehensive in-situ nanomechanical test instrument for SEM and FIB/SEM, featuring our full suite of techniques.

Hysitron TS 75 TriboScope | Bruker

TS 75 TriboScope

Quantitative, rigid-probe nanoindentation and nanotribological characterization on your existing AFM.