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Brochures

• Bruker Hysitron PI 85L SEM PicoIndenter - Brochure 1 MB

The PI 85L is a depth-sensing nanomechanical test instrument that can be interfaced with a scanning electron microscope (SEM). With this system it is possible to perform quantitative mechanical testing while simultaneously imaging with the SEM. Coupling these two techniques allows the researcher to position the probe extremely accurately and to image the deformation process throughout the test.