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Nanomechanical Test Instrument

Bruker’s TI 950 TriboIndenter

Hysitron TI 950 TriboIndenter nanoindenter has been developed as an automated, high throughput instrument to support the numerous nanomechanical and nanotribological characterization techniques developed by Bruker. The Hysitron TI 950 nanoindenter system incorporates the powerfulperformech® I Advanced Control Module, which greatly improves the precision of feedback-controlled nanomechanical testing, provides dual head testing capability for nano/micro scale connectivity, and offers unprecedented noise floor performance. The numerous nanomechanical testing techniques offered by Bruker, as well as new testing methods currently being developed, make the HysitronTI 950 TriboIndenter an extremely versatile and effective nanomechanical characterization tool for the broadest range of applications. 

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Hysitron TI 950 Nanoindenter | Bruker
surface analysis

Superior Control and Sensitivity

The combination of Bruker’s performance-leading feedback control algorithms and superior measurement sensitivity provides precise control for all Hysitron nanomechanical testing techniques. All feedback control functionalities on the Hysitron TI 950 are carried out by a dedicated digital-signal processor (DSP) and field-programmable gate array (FPGA) embedded control system to accurately follow the inputted request of the user.

Low-Force Indentation Tests | Bruker
Capacitive Transducer | Bruker

Capacitive Transducer Technology

Proprietary capacitive transducer technology provides unprecedented measurement sensitivity (<30 nN, <0.2 nm), accuracy, and reliability during the nanoindentation process. Electrostatic actuation uses little current, enabling superior drift characteristics that result in faster data acquisition, higher accuracy, and better repeatability.

High-Resolution Optics with In-Situ SPM Imaging

Top-down optics with a color CCD camera have been incorporated into the Hysitron TI 950 TriboIndenter for high magnification and visual observation of sample surfaces and the selection of testing locations. For greater precision in probe placement, in-situ SPM imaging can be used to refine the probe position to within ±10 nm. The dual modes of imaging provided by the Hysitron TI 950 allow precise positioning of the probe to accommodate the multitude of applications for which it is used.

In-Situ SPM Imaging | Bruker