Hysitron TI 980 TriboIndenter | Bruker
nanoDMA III - Dynamic Nanoindentation | Bruker


nanoDMA III - Dynamic Nanoindentation


Bruker’s nanoDMA III is a powerful dynamic nanoindentation technique that provides continuous measurement of elastic-plastic and viscoelastic properties as a function of indentation depth, frequency, and time.



XPM — Accelerated Property Mapping


Bruker’s XPM sets a new industry standard for nanomechanical testing throughput paired with measurement resolution and accuracy. At up to 6 nanoindentation measurements/second, XPM delivers comprehensive nanomechanical property maps and property distribution statistics in a record amount of time.

XPM - High Speed Nanoindentation | Bruker
SPM+ Imaging | Bruker

SPM+ Imaging


Bruker’s pioneering scanning nanoindenters utilize the same probe to both raster the sample surface for topography imaging and to conduct the nanomechanical test. In-situ SPM imaging maximizes test placement accuracy, provides immediate post-test observation of material deformation behavior, and accelerates testing throughput.



Nanoindentation


Precise lateral positioning and nanoscale load and depth control allow for the quantitative determination of localized mechanical properties such as elastic modulus, hardness, creep, stress relaxation, and fracture toughness for a wide variety of materials.

Nanoindentation | Bruker
Nanoscratch | Bruker


Nanoscratch


Ultra-sensitive force and displacement measurements in both the normal and lateral directions enable quantitative nanoscale tribological characterization on individual microstructures and interfaces, along with interfacial adhesion characterization of ultra-thin films.



Nanowear


Quantify wear behavior over the nanometer to micrometer length scales as a function of number of sliding cycles, sliding velocity, wear area, and applied force.

Nanowear | Bruker

UPGRADE OPTIONS

Offering broadest range of innovative characterization techniques to keep you at the forefront of materials development

surface analysis
In Operando Nanomechanics | Bruker

In Operando Nanomechanics
High Temperature, Low Temperature, Humidity, Atmosphere

Raman Spectroscopy | Bruker

Raman Spectroscopy
Combined Raman Spectroscopy and Nanomechanical Testing

Modulus Mapping | Bruker

Modulus Mapping™
Quantitative, High-Resolution Surface Modulus Characterization

nanoECR | Bruker

nanoECR
In-Situ Electrical Contact Resistance

TriboAE | Bruker

TriboAE
In-Situ Acoustic Emission Monitoring

xProbe | Bruker

xProbe
Quantitative Rigid Probe Nanoindentation with AFM Resolution

3D OmniProbe | Bruker

3D OmniProbe™
Quantitative Indentation and Scratch into the Microscale

MultiRange NanoProbe | Bruker

MultiRange NanoProbe™
Depth-Sensing Microindentation

TriboImage | Bruker

TriboImage™
Time Resolved Friction/Wear Mapping

iTF | Bruker

iTF
Patented Intrinsic Thin Film Property Models

Nanomechanical Test Probes | Bruker

Test Probes
Nanomechanical and Nanotribological Testing Probes

Fluorescence Microscopy | Bruker

Fluorescence Microscopy
Target Testing Regions Tagged by Fluorochromes

Sample Chucks | Bruker

Sample Chucks
Sample Mounting Chucks for Every Application

Automated Probe Changer | Bruker

Automated Probe Changer
Fully Automated Nanomechanical & Nanotribological Probe Change System

Electrochemical Cell | Bruker

Electrochemical Cell
Nanomechanical Testing in Fluids with Electrochemical Capabilities