Nanoscale Creep Characterization | Bruker


Quantitative Nanoscale Creep Characterization

When viscoelastic and viscoplastic materials are subjected to a constant stress for a period of time, a time-dependent deformation occurs, known as creep. During a nanoindentation test, creep is observed as an increase in depth of the indenter probe held at a constant force as a function of time. Accuracy of creep data at the nanoscale is highly dependent on nanoindentation system’s thermal stability, precise control of applied force, and sensitivity in measuring small changes in probe displacement. Nanoindentation allows quantitative creep characterization of thin films, individual microstructures, functionally graded interfaces, and small surface structures.

Bruker’s unique electrostatic transducer technology provides quantitative and reliable creep characterization at the nanoscale. In contrast to other electrical current-based actuation techniques that suffer from thermal drift, Bruker’s electrostatic actuation produces negligible heat when in operation. Combined with industry-leading noise floors and ultra-fast feedback control algorithms provided by Bruker’s Hysitron Performech Advanced Control Technology, creep testing can be performed on a scale not possible utilizing other technologies. Additionally, nanoDMA III incorporates unique reference frequency algorithms to provide drift-free creep measurements over long time periods. nanoDMA III used in conjunction with one of Bruker’s temperature control stages enables accurate nanoscale creep characterization at non-ambient temperatures and determination of creep activation energies.

Standalone Equipment for Nanoscale Creep Characterization

Hysitron TI 980 TriboIndenter | Bruker

TI 980 TriboIndenter

Bruker's most advanced nanomechanical and nanotribological test instrument, operating at the intersection of maximum performance, flexibility, reliability, sensitivity and speed.

Hysitron TI Premier | Bruker

TI Premier

Versatile nanomechanical and nanotribological test instrument, supporting a broad range of hybrid and correlative characterization techniques.

Hysitron TS 77 Select Nanoindenter | Bruker

TS 77 Select

Dedicated nanomechanical test instruments, providing an essential toolkit of core nanoscale mechanical characterization techniques.

Microscope Instruments for Nanoscale Creep Characterization

Hysitron TS 75 TriboScope | Bruker

TS 75 TriboScope

Quantitative, rigid-probe nanoindentation and nanotribological characterization on your existing AFM.

Hysitron PI 8X SEM PicoIndenter BRUKER

PI 89 SEM PicoIndenter

Bruker’s comprehensive in-situ nanomechanical test instrument for SEM and FIB/SEM, featuring our full suite of techniques.

Hysitron PI 95 TEM PicoIndenter | Bruker

PI 95 TEM PicoIndenter

The first full-fledged depth-sensing indenter capable of direct-observation nanomechanical testing inside a transmission electron microscope (TEM).