Nanoscale Stress Relaxation | Bruker

Stress Relaxation

Quantitative Nanoscale Stress Relaxation Characterization

Nanoindentation measurements, when operating under displacement feedback control, enable quantitative stress relaxation measurements to be performed at the nanoscale. During a stress relaxation measurement, an indenter probe is pressed into a material’s surface until it reaches a user-defined displacement. The displacement of the indenter probe is held constant while the force acting on the probe is continually measured. Stress relaxation properties are extracted utilizing the measured decay in force as a function of hold time. The localized nature of nanoindentation enables stress relaxation measurements to be performed on a range of materials, from thin films to individual phases of complex microstructures.

Bruker’s unique electrostatic transducer technologies provide high-accuracy stress relaxation measurements to be reliably performed at the nanoscale. Cutting-edge control electronics and fast feedback control algorithms provide a stable probe displacement and industry-leading force measuring capabilities. Combined with Bruker's Hysitron in-situ SPM imaging, stress relaxation tests can be positioned within ±10nm of the desired testing location for maximum reliability in test results.

Standalone Equipment for Stress Relaxation Characterization

Hysitron TI 980 TriboIndenter | Bruker

TI 980 TriboIndenter

Bruker's most advanced nanomechanical and nanotribological test instrument, operating at the intersection of maximum performance, flexibility, reliability, sensitivity and speed.

Hysitron TI Premier | Bruker

TI Premier

Versatile nanomechanical and nanotribological test instrument, supporting a broad range of hybrid and correlative characterization techniques.

Hysitron TS 77 Select Nanoindenter | Bruker

TS 77 Select

Dedicated nanomechanical test instruments, providing an essential toolkit of core nanoscale mechanical characterization techniques.

Microscope Instruments for Stress Relaxation Characterization

Hysitron PI 85L SEM PicoIndenter | Bruker

PI 85L SEM PicoIndenter

Depth-sensing nanomechanical test instrument that can be interfaced with scanning electron microscopes (SEM).

Hysitron PI 8X SEM PicoIndenter BRUKER

PI 89 SEM PicoIndenter

Bruker’s comprehensive in-situ nanomechanical test instrument for SEM and FIB/SEM, featuring our full suite of techniques.

Hysitron PI 95 TEM PicoIndenter | Bruker

PI 95 TEM PicoIndenter

The first full-fledged depth-sensing indenter capable of direct-observation nanomechanical testing inside a transmission electron microscope (TEM).


Hysitron TS 75 TriboScope | Bruker

TS 75 TriboScope

Quantitative, rigid-probe nanoindentation and nanotribological characterization on your existing AFM.