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FASTspectra OPO


Upgrade your nanoIR platform with the highest available resolution and measurement sensitivity with the new FASTspectra OPO mid-IR laser

Anasys Instruments patented Resonance Enhanced AFM-IR mode has significantly improved the sensitivity of the AFM-IR technique demonstrating high measurement sensitivity on extremely thin films, including single polymer lamellae, self-assembled monolayers and biological membranes. Now Anasys Instruments has further improved the capabilities of AFM-IR with the introduction of a new OPO FASTspectra™ laser for all nanoIR™ platforms.
The new high pulse rate OPO laser extends the wavelength range of Resonance Enhanced AFM-IR to cover the 2700 to 3600cm-1 wavenumbers, extending capability to important spectroscopic regions and addressing wider range of applications, while still providing direct correlation to FTIR at the nanoscale.
The system sets new standards in resolution and sensitivity.
The new OPO laser also incorporates FASTspectra, a proprietary technology providing high speed IR spectra measurement in seconds improving time to data or enabling more detailed understanding of the sample. The FASTspectra -OPO laser compliments the standard FASTspectra QCL laser option that provides coverage from 950 to 1900cm-1

 

 

FASTspectra OPO

Breaking the diffraction limit with resonance enhanced AFM-IR

Breaking the diffraction limit with resonance enhanced AFM-IR
AFM-IR with Resonance Enhancement works by illuminating a sample with high rate pulses of infrared radiation and using the tip of an AFM to detect the absorbed radiation with nanoscale spatial resolution. Specifically, IR light absorbed by the sample is converted to heat, causing a rapid thermal expansion pulse under the AFM tip, in turn exciting resonant oscillation of the AFM cantilever. The amplitude of the cantilever oscillation is directly proportional to the sample absorption coefficient. AFM-IR absorption spectra are created by measuring the cantilever oscillation amplitude as a function of the wavelength of the incident radiation. Each absorption peak corresponds to excitation of a specific molecular resonance and the pattern of peaks, i.e. the absorption spectrum act as a unique chemical fingerprint of a nanoscale region of the sample.
The key difference between AFM-IR and resonance enhanced mode is that the lasers provides lower power and higher pulsed rates providing high sensitivity and IR spatial and spectral resolution with higher acquisition times for spectroscopy.

 

 

FASTspectra OPO Table