Micro-XRF and TXRF

Micro X-ray Fluorescence Spectrometry (Micro-XRF) and Total Reflection X-ray Fluorescence Spectrometry (TXRF) – Elemental Analysis, Process and Quality Control

Micro X-ray fluorescence spectrometry (Micro-XRF) provides highest spatial resolution with spot sizes down to 25 µm. The fields of application comprise analyses of art objects (ARTAX), jewelry (M1 ORA), bulk materials and metallic coatings (M1 MISTRAL, M2 BLIZZARD), and high speed “on the fly” measurements of any kind of sample (M4 TORNADO). The M6 JETSTREAM is designed for the analysis of large samples.

Total reflection X-ray fluorescence spectrometry (TXRF) is the only X-ray technology offering detection limits in the low ppb range. TXRF is the method of choice for fast quantitative and semi-quantitative multi-element trace analysis (S4 TStar, S2 PICOFOX).