M4 TORNADO, 2D µ-XRF, Ultimate Speed and Accuracy

Mining industries - Fast ore characterization combining benchtop Micro-XRF and automated SEM-EDS

Energy dispersive spectrometry (EDS) using scanning electron microscopes (SEM) and micro-X-ray fluorescence spectrometry (Micro-XRF) can be performed rapidly since the introduction of silicon drift detector (SDD) technology. The combination of SEM-EDS and benchtop Micro-XRF allows an advanced workflow for the characterization of ore. Applied to the examples discussed here, ore thick sections from an offset dike of the Sudbury Igneous Complex (SIC), this translates to:

  1. Detecting the presence of high demand elements (Co, Ni, Cu, Pt, Pd, As, Te, …) rapidly using Micro-XRF for determining the value of ores.
  2. Locating mineral phases of economic interest with SEM-EDS using automated feature analysis.
  3. Analyzing them at high spatial resolution using low accelerating voltages to gain insights in arsenide, telluride and sulfide deposit models.

Download the full application note # EDS-13 (PDF)