M4 TORNADO

<20

μm

光斑大小

聚焦X射线多导毛细管

1

ms

单个像素像素点最短停留时间

面扫描中样品台移动速度可高达 100 mm/s

12

镀层分析

可选配XMethod软件分析多层镀层样品

高性能微区XRF，具有市场领先的分析速度和功能多样性

M4 TORNADO 是使用小光斑微区 X 射线荧光进行样品表征的首选设备。其测量结果能够提供样品的相关成分和元素分布的信息，甚至样品表面下元素分布信息。Bruker微区X射线光谱仪经过优化，可对任何类型的样品的点、线和二维区域扫描（Mapping）进行高速分析; 样品类型可为固态，液态，颗粒等。

靶材产生的X 射线经过多导毛细管聚焦后，在保证荧光强度的同时可产生极小的光斑。M4 TORNADO 可选配多个Bruker XFlash 硅漂移探测器（SDD），可在不影响能量分辨率的情况下实现荧光信号的高吞吐量处理。

M4 TORNADO 还可额外选配第二根X 射线光管，它提供了不同的靶材以及准直器，可实现设备分析功能的极大拓展。

其他可选高级配置选项：

He吹扫能够极大提高轻元素检测灵敏度，使得设备可在样品仓常压下对轻元素检测
可快速更换的地质样品测试支架，适用于矿物薄片和岩芯测试
XMethod 软件，支持用户自主建立包含镀层在内的多样定量分析方法
用于矿物分析的AMICS 软件

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M4 TORNADO 如何支持您的分析？

测量时间短。优化的 X 射线光路、高通量探测器、"On-the -fly" mapping ，单点测试时间可低至 1 ms。

测量样品高达 7kg。大型真空样品仓，可自由调节真空度，最低可至2mbar，自动He或N2吹扫，可检测含水样品中的轻元素。

单次面扫描面积高达 190 x 160 mm2 的面积。单次扫描多达 4000万像素点。数据存储为HyperMap，包含所有像素点光谱信息以及光学图像。

定量分析单点，线扫描，面扫描测试结果。配置的基本参数方法，可选的XMethod软件包，实现对镀层等样品的准确定量。

处理数据。强大的分析软件，可在面扫描结果中选择任意对象（椭圆，矩形，多边形）进行光谱提取，线扫描数据提取，最大像素光谱，相分析。

扩展功能。可结合用户实际需求提供定制化配置，以满足您的分析需求。

Further Enhance your Analytical Capabilities

The M4 TORNADO can be further enhanced with optional features to address your analytical challenges. From the analysis of light elements to the high-resolution imaging of samples with complex topographies.

LE Option: Light Element Detection with the M4 TORNADO

Light element analysis is possible using the M4 TORNADO Light Element (LE) option.

The LE option significantly improves sensitivity in the low-energy range of 0.5–4 keV facilitating the micro-XRF analysis of elements as light as oxygen. This is achieved through advanced detector technology with ultra-thin windows, a fully controlled vacuum system that enhances low-energy X-ray transmission, and a magnetic electron trap that reduces noise and protects the detector.

Together, these features deliver clear, reliable results for elements such as sodium, magnesium, aluminum, and fluorine.

If even greater levels of light element detection are required we recomend using the M4 TORNADO PLUS.

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NIST 620 spectra measured with the M4 TORNADO, M4 TORNADO – LE and M4 TORNADO PLUS. The LE option significantly increases sensitivity in the low energy range for the M4 TORNADO. The M4 TORNADO PLUS further benefits from an optimized source.

AMS Option: Sharper Results with Smart Aperature Management System

The Aperture Management System (AMS) option for the M4 TORNADO enhances micro-XRF performance by reducing beam divergence and maintaining a nearly constant spot size, even on samples with uneven surfaces. By reshaping the polycapillary output into a more focused beam profile, AMS preserves high intensity while delivering improved spatial resolution without the need for additional optics.

AMS is available in two options (500 or 1000) which, when needed, can be seamlessly inserted into the beam path via software control.

The AMS Option is particularly valuable for the analysis of samples with fine structural details and surfaces of high topography, such as geological samples, cultural heritage objects and advanced materials.

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Micro-XRF maps of an emerald sample with over 5 mm topography, measured without AMS (left) and with AMS 500 (right); the AMS 500 reduces beam diameter from approximately 300 μm to less than 150 μm, enabling clear visualization of Cr zonation bands.