M4 TORNADO, 2D µ-XRF, Ultimate Speed and Accuracy
Dual Detector

Apart from increasing the speed of data acquisition, a second detector offers other additional advantages. Mounted in a different position, it allows easy identification of diffraction peaks that are invariably caused when analyzing crystalline material. A second detector also reduces shadowing effects, e.g. when mapping rough samples.

 

M4_diffraction_peaks.jpg