X-ray Diffraction (XRD) and Scattering

Materials property characterization from fundamental research to industrial quality control

Bruker's X-ray portfolio covers a wide range of X-ray scattering techniques for materials characterization and quality control of crystalline or non-crystalline materials such as powders, solid blocks, nanoparticles, thin films, epitaxial layers, or liquids.

Techniques include X-ray powder diffraction (XRPD) including Rietveld (TOPAS), diffuse or "total" scattering (PDF analysis), small angle X-ray scattering (SAXS) and thin-film analysis. The unique D8 platform design allows to configure each instrument for a wide range of applications.

Bruker, AXS, Daltonics, BioSpin, Optics, Corporation
PILATUS3 R 100K-A 2D X-ray detector

Read more on the new DECTRIS Hybrid Photon Counting (HPC) Pixel Detector - 2D X-ray detector for D8 DISCOVER diffraction solutions (Press Release)

Our X-ray diffraction instruments

  • D2 PHASER – desktop X-ray diffraction tool
  • The new D8 ENDEAVOR – advanced XRD for Process and Product Quality Control
  • D8 ADVANCE ECO – ECOfriendly, ECOnomical, ECOperformance
  • D8 ADVANCE – all-purpose diffraction solution for X-ray diffraction
  • D8 DISCOVER – advanced X-ray diffraction system for materials research applications
  • D8 FABLINE – metrology solution for semiconductor industry

Our SAXS instruments

  • N8 HORIZON – compact small angle X-ray scattering system for advanced materials research
  • NANOSTAR – top of the line small angle X-ray scattering solution
  • MICRO Series – top-speed SAXS/WAXS for bio research

For more information please contact us.