Top performance in XRD
The D8 DISCOVER is the flagship multi-purpose X-ray diffractometer offering leading technology components. It is designed for the structural characterization of the full range of materials from powders, amorphous and polycrystalline materials to epitaxial multi-layered thin films at ambient and non-ambient conditions.
The IµS microfocus source equipped with MONTEL optics provides a small high intensity x-ray beam that is perfectly suited for the investigation of small areas or samples.
The D8 DISCOVER offers a multitude of UMC stages with unrivalled mapping and weight capacity:
Due to the high modularity the UMC stages can be customized to match customer requirements that go beyond the standard configurations.
The EIGER2 R 250K and 500K are the 2D detectors that bring Synchrotron performance to laboratory X-Ray Diffraction
The patented TRIO optics enables automated switching between three beampaths:
The PATHFINDERPlus optic includes an automated absorber to ensure linearity of the measured intensities and allows to switch between:
Equipped with TRIO and PATHFINDERPlus the D8 DISCOVER masters all sample types including powder, bulk, fiber, sheet and thin-film (amorphous, polycrystalline and epitaxial) under ambient or non-ambient conditions without any need of reconfiguration.
X-Ray Diffraction (XRD) and reflection play a dominant role in the non-destructive characterization of thin layer structured samples. The D8 DISCOVER and DIFFRAC.SUITE software support simple execution of common XRD methods in thin film analysis:
XRD is one of the most important tools in materials research as it allows linking of structural and physical properties of materials. The D8 DISCOVER is the flagship XRD instrument for materials research. Equipped with leading technology components the D8 DISCOVER delivers top performance and full flexibility and enables researchers for a detailed characterization of their materials:
The D8 DISCOVER is the ultimate solution when it comes to High-Throughput Screening (HTS) and the mapping of large areas on samples. The UMC sample stages deliver a range of motion that puts the D8 DISCOVER in a class of its own in both motorized translation and weight capacity:
Easy switch between point and line focus
Available anodes: Cr, Cu, Mo, Ag
Max. Power and filament: up to 3 kW depending on anode material (0,4 x 16 mm² )
Patent: EP 1 923 900 B1
Quick change of the wavelength to perfectly match different applications
Fastest switch between line and point focus for a wider range of applications and better results in shorter time
|IµS Microfocus Source||
Power load: up to 50 W, single-phase power
MONTEL and MONTEL Plus optics combining parallel and focusing mirrors.
Beam sizes down to 180 x 180 µm².
Maximum integrated flux 8 x 10⁸ cps at mirror exit.
Beam divergence down to 0,5 mrad
Millimeter sized beam with high brilliance and ultra-low background
Green design with low power consumption, no water consumption and extended life components
Optimize the beam shape and divergence for best results
|Turbo X-Ray Source (TXS)||
Line focus, 0.3x3 mm²
Focal brigthness of 6 kW/mm²
Anode materials: Cu, Co, Cr, Mo
Max. voltage 50 kV, max. power depending on anode material: Cr 3.2 kW, Cu/Mo 5.4 kW, Co 2,8 kW
Pre-Aligned Tungsten filament
Up to 5 times more intensity compared to standard ceramic X-ray sources.
Perfectly suited for line and spot focus applications
Pre-Aligned filament allow fast filament exchange with a minimum of re-alignment requirement.
Software push-button switch between:
Motorized Divergence Slit (Bragg-Brentano)
High Intensity Ka1,2 Parallel Beam
High Resolution Ka1 Parallel Beam
Patents: US10429326, US6665372, US7983389
Fully automatic, motorized switching between up to 6 different beam geometries without any manual user intervention
Perfectly suited for all sample types including powders, bulk materials, fibers, sheets and thin-films (amorphous, polycrystalline and epitaxial)
Ge(220) and Ge(004) reflections in symmetric and asymmetric geometry
2-bounce and 4-bounce (Bartels type) monochromators
Alignment-free mounting through SNAP.LOCK technology
Broad choice for best resolution vs. intensity balancing to obtain best possible results.
Fast exchange of monochromators to optimize to different samples
|D8 Goniometer||Two-circle goniometer with independent stepper motors and optical encoders||
Unparalleled accuracy and precision as manifasted by Bruker's unique alignment guarantee
Absolutely maintenance free drive mechanism / gearings with lifetime lubrication
Family of sample stages
x,y for sample translation of up to +/- 150 mm
z-Drive with travel of up to 50 mm
Phi drive with infinite rotation
Max. Psi inclination up to 55°
Max. weight (at center position) : 50 kg
Unrivalled capacity in sample weight and size
Enables the implementation of large custom-made sample chambers
|Centric Eulerian Cradle (CEC)||
Five degrees of freedom sample stage:
x,y for sample translation of +/-40 mm
z-Drive for height alignment
Phi drive with 360° rotation
Psi drive and angular range from -11° to 98°
Max. weight load: 1 kg
Various stage attachment avaible.
Stress and Texture measurements in side-inclination for higher accuracy results.
Automated mapping capability in (x,y).
Motorized tilt-stage for precise surface alignment.
Powder- or capillary spinners allow for powder diffraction.
Bayonette sample stage holder for fast and reproducible swapping with other stages.
|Pathfinder Plus Optics||
Software push-button switch between:
2-bounce Ge Analyzer
Automated absorber integrated
Fully automatic, motorized switching between two different optics without any manual user intervention.
Maintains full field of view of LYNXEYE detectors.
Absorber ensures linearity in measured data
Energy Resolution: < 380 eV @ 8 KeV
Detection Modes: 0D,1D, 2D
Wavelengths: Cr, Co, Cu, Mo and Ag
Patents: EP1647840, EP1510811, US20200033275
No need for Kß filters and secondary monochromators
100% filtering of Fe-fluorescense with Cu radiation
Up to 450 times faster than conventional detector systems
Bragg2D: Collect 2D data with a divergent primary line beam
Unique detector warranty: No defective channels at delivery time
|EIGER2||The latest generation multi-mode (0D/1D/2D) detector based on the Hybrid Photon Counting technology, developed by Dectris Ltd.||
Seamless integration of 0D, 1D and 2D detection in step, continuous and advanced scanning modes
Ergonomic, alignment-free detector rotation to optimize γ or 2Θ angular coverage
Panoramic, tool-free diffracted beam optics using the complete detector field of view
Continuously variable detector positioning to balance angular coverage and resolution
Temperature: Ranging from ~12 K up to ~2500 K
Pressure: 10-⁴ mbar up to 100 bar
Humidity: 5% to 95% RH
Investigations under ambient and non-ambient conditions
Easily exchanged stages with DIFFRAC.DAVINCI
Bruker XRD solutions consist of high performance components configured to meet the analytical requirements. The modular design is the key to configure the best instrumentation.
All categories of components are part of Bruker’s key competence, developed and manufactured by Bruker AXS, or in close cooperation with third party vendors.
Bruker XRD components are available for upgrading the installed X-ray systems for improving their performance.
Check out our support website for: