eFlash XS

Simplicity is the ultimate sophistication!

To significantly increase the number of labs able to acquire an integrated EDS & EBSD system, Bruker Nano Analytics has developed eFlash XS, a unique EBSD detector dedicated to the affordable part of the SEM market. The eFlash XS EBSD detector was purposely designed to be installed on low footprint SEMs, like tabletop SEMs and standard SEMs with small chambers.

Our EBSD expertise has been tapped for developing the most reliable and most affordable EBSD detector ever, while providing excellent performance. Designed for maximum reliability, ease of use and pattern quality, eFlash XS is powered by a binning capable CMOS camera, an innovative optical system for maximum light transmission and a high-performance user-replaceable phosphor screen. Its USB3.0 computer connection (power & data) makes eFlash XS a truly plug-n-play instrument. When not in use, the in-SEM portion of the EBSD detector slides off for external storage, to eliminate any risk of the SEM stage colliding with the detector.

The new eFlash XS EBSD detector is integrated with a 6th generation XFlash® EDS detector under the ESPRIT 2 software to create the QUANTAX ED-XS, a powerful combination of analytical techniques for the entry level SEM market.

New eFlash XS, the most reliable and most affordable EBSD detector ever

Main Benefits (Hardware & Software)

Ease of use

  • No calibration required – WD variation impact on pattern center is automatically corrected
  • Binning/pattern resolution change is not required; all binning modes are available if needed
  • Automatic camera gain
  • Automated crystal phase setup – no user-intervention required
  • No risks of accidental EBSD detector insertion into stage
  • User-replaceable phosphor screen
  • Stand-alone and simultaneous acquisition of EDS HyperMap and EBSD map included
  • Automated data saving
  • Automatic EHT shutdown at the end of map acquisition is user-selectable 

New users can be trained and practice EDS & EBSD with less time constraints

Sample preparation quality can be checked before an EBSD session on an expensive FE-SEM

Run routine EBSD analyses on affordable SEMs to reduce FE-SEM backlog

Important Specs

  • Native image resolution: 720 x 540 pixels
  • Supported binning modes: 2x2, 3x3, 4x4, 5x5, 6x6
  • Speed: 525 frames/second (fps) in all binning modes
  • User-removable detector head – slide in and out mechanism 
  • User-replaceable phosphor screen
  • EBSD data and power transfer via USB3.0 cable (no additional cables or boxes required)
  • Outer dimensions: length ~ 84 mm, diameter ~ 48 mm